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Imaging of spatial distributions of the millimeter wave intensity by using visible continuum radiation from a discharge in a Cs–Xe mixture. Part I: Review of the method and its fundamentals

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Abstract

The first part of the review is presented which is dedicated to the time-resolved method of imaging and measuring the spatial distribution of the intensity of millimeter waves by using visible continuum (VC) emitted by the positive column (PC) of a dc discharge in a mixture of cesium vapor with xenon. The review focuses on the operating principles, fundamentals, and applications of this new technique. The design of the discharge tube and experimental setup used to create a wide homogeneous plasma slab with the help of the Cs–Xe discharge at a gas pressure of 45 Torr are described. The millimeter-wave effects on the plasma slab are studied experimentally. The mechanism of microwave-induced variations in the VC brightness and the causes of violation of the local relation between the VC brightness and the intensity of millimeter waves are discussed. Experiments on the imaging of the field patterns of horn antennas and quasi-optical beams demonstrate that this technique can be used for good-quality imaging of millimeter-wave beams in the entire millimeter-wavelength band. The method has a microsecond temporal resolution and a spatial resolution of about 2 mm. Energy sensitivities of about 10 μJ/cm2 in the Ka-band and about 200 μJ/cm2 in the D-band have been demonstrated.

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  1. Institute of Applied Physics, Russian Academy of Sciences, Nizhny Novgorod, 603950, Russia

    M. S. Gitlin

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Original Russian Text © M.S. Gitlin, 2017, published in Uspekhi Prikladnoi Fiziki, 2015, Vol. 3, No. 6, pp. 515–536.

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Gitlin, M.S. Imaging of spatial distributions of the millimeter wave intensity by using visible continuum radiation from a discharge in a Cs–Xe mixture. Part I: Review of the method and its fundamentals. Plasma Phys. Rep. 43, 253–270 (2017). https://doi.org/10.1134/S1063780X17020040

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  • DOI: https://doi.org/10.1134/S1063780X17020040

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