Abstract
The pressure dependence of permittivity χ of direct gap ZnO, CdTe, InSb, InAs, CdSnAs2, and CdGeAs2 semiconductors in the hydrostatic pressure range from zero to 1 GPa is determined from the results of quantitative analysis of the pressure dependences of resistivity ρ(P) and Hall constant R H (P). It is found that the dielectric constant decreases upon an increase in pressure so that coefficient (dχ/d P )/χ increases with (dE g /dP)/E g .
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Original Russian Text © M.M. Gadzhaliev, M.I. Daunov, A.M. Musaev, 2015, published in Zhurnal Eksperimental’noi i Teoreticheskoi Fiziki, 2015, Vol. 148, No. 2, pp. 304–307.
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Gadzhaliev, M.M., Daunov, M.I. & Musaev, A.M. Dependence of the permittivity of direct gap semiconductors on hydrostatic pressure. J. Exp. Theor. Phys. 121, 263–266 (2015). https://doi.org/10.1134/S106377611508004X
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DOI: https://doi.org/10.1134/S106377611508004X