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Diffraction of X-rays in Crystals: A Tensor Approach

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Abstract

The use of X-ray synchrotron radiation makes it possible to observe the polarization, spectral, and angular dependences for diffraction reflections. Their theoretical study calls for application of a tensor approach to describe the interaction of X-rays with atoms of matter. Various representations of the tensor atomic scattering amplitude, results of experimental observations of the anisotropy of resonant X-ray scattering, and the relationship of the electric and magnetic multipole moments on atoms with the properties of forbidden resonant reflections are considered.

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ACKNOWLEDGMENTS

We are grateful to V.A. Chizhikov for his help in drawing Fig. 3.

Funding

The study was supported in part by the Ministry of Science and Education of the Russian Federation, grant no. 075-15-2021-1353. Dmitrienko acknowledges the support of the Ministry of Science and Higher Education of the Russian Federation within the State assignment for the Federal Scientific Research Centre “Crystallography and Photonics” of the Russian Academy of Sciences.

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Authors and Affiliations

  1. Moscow State University, 119991, Moscow, Russia

    A. P. Oreshko & E. N. Ovchinnikova

  2. Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, 119333, Moscow, Russia

    V. E. Dmitrienko

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  1. A. P. Oreshko
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Correspondence to E. N. Ovchinnikova.

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Oreshko, A.P., Ovchinnikova, E.N. & Dmitrienko, V.E. Diffraction of X-rays in Crystals: A Tensor Approach. Crystallogr. Rep. 68, 351–362 (2023). https://doi.org/10.1134/S1063774523700013

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