Skip to main content
Log in

Three-dimensional reconstruction of a surface based on scanning electron microscopy images

  • Surface and Thin Films
  • Published:
Crystallography Reports Aims and scope Submit manuscript

Abstract

Modern methods of three-dimensional reconstruction of sample surfaces based on scanning electron microscopy images allow one to quantitatively estimate morphological surface characteristics (specifically, parameters of irregularities, volumes of convexities and concavities, etc.). The accuracy of the method is analyzed by an example of commercial and specially prepared test samples. Examples of application to various objects are given.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. J. Goldstein, D. Newbury, D. Joy, et al., Scanning Electron Microscopy and X-Ray Microanalysis (Kluwer, New York, 2003), p. 212.

    Book  Google Scholar 

  2. X. Jining, Stereomicroscopy: 3D Imaging and the Third Dimension Measurement. Application Note (Agilent Technologies, USA, 2011).

    Google Scholar 

  3. O. C. Wells, Br. J. Appl. Phys. 11, 199 (1960).

    Article  ADS  Google Scholar 

  4. J. B. Pawley, Inst. Phys. Conf. Ser. 1, 233 (1988).

    Google Scholar 

  5. R. I. Garrod and J. F. Nankivell, Br. J. Appl. Phys. 9, 214 (1958).

    Article  ADS  Google Scholar 

  6. J. F. Nankivell, Br. J. Appl. Phys. 13, 126 (1962).

    Article  ADS  Google Scholar 

  7. http://www.alicona.com/home/products/mex/automatic-calibration.html

  8. M. L. Zanaveskin, A. A. Andreev, I. O. Maiboroda, et al., Proc. IX All-Russia Conf. “Gallium, Indium, and Aluminum Nitrides: Structures and Devices”, Moscow, June 13–15, 2013), p. 84.

  9. I. A. Chernykh, A. M. Stroev, L. V. Klevalina, et al., Pis’ma Zh. Tekh. Fiz. 38(18), 53 (2012).

    Google Scholar 

  10. I. A. Chernykh, M. L. Zanaveskin, A. M. Stroev, et al., ELEKTRO. Elektrotekh., Elektroenergetika, Elektrotekh. Prom-st. 2, 7 (2013).

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to A. L. Vasiliev.

Additional information

Dedicated to the International Year of Crystallography

Original Russian Text © A.A. Mikhutkin, A.L. Vasiliev, 2014, published in Kristallografiya, 2014, Vol. 59, No. 6, pp. 999–1007.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Mikhutkin, A.A., Vasiliev, A.L. Three-dimensional reconstruction of a surface based on scanning electron microscopy images. Crystallogr. Rep. 59, 908–915 (2014). https://doi.org/10.1134/S1063774514060212

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S1063774514060212

Keywords

Navigation