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Computer analysis of two-dimensional images in the Zernike phase contrast method for hard X rays

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Abstract

The problems of the numerical simulation of two-dimensional images in the Zernike phase contrast method in hard X rays are analyzed. Calculations are performed for experimental conditions typical of third-generation synchrotron radiation sources (ESRF, APS, Spring-8, etc.). Schemes are considered where the focusing elements are a refracting lens and a zone plate and the phase-shifting element is situated at the point of the source image. It is shown that the refracting lens allows better resolution than the zone plate. A technique similar to ptychography can be successfully applied to improve the quality of the images obtained by the Zernike phase contrast method.

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Authors and Affiliations

  1. National Research Centre “Kurchatov Institute,”, pl. Akademika Kurchatova 1, Moscow, 123182, Russia

    V. G. Kohn

  2. Moscow State University, Moscow, 119991, Russia

    M. A. Orlov

Authors
  1. V. G. Kohn
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  2. M. A. Orlov
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Correspondence to V. G. Kohn.

Additional information

Original Russian Text © V.G. Kohn, M.A. Orlov, 2012, published in Kristallografiya, 2012, Vol. 57, No. 5, pp. 756–761.

On the 100th anniversary of the discovery of X-ray diffraction

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Kohn, V.G., Orlov, M.A. Computer analysis of two-dimensional images in the Zernike phase contrast method for hard X rays. Crystallogr. Rep. 57, 676–681 (2012). https://doi.org/10.1134/S1063774512050082

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  • DOI: https://doi.org/10.1134/S1063774512050082

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