Abstract
A new method of X-ray microscopy using synchrotron radiation is theoretically analyzed. The method is based on the concepts of near-field phase contrast and nanofocusing using a planar compound refractive lens, which forms a secondary source with a small transverse size at a short distance from the sample. A computer experiment on imaging a two-dimensional photonic crystal with a period of 0.5 µm has been carried out. A universal program has been developed for carrying out computer experiments in the field of coherent X-ray optics. It is shown that the method proposed is characterized by high resolution, locality, and large luminosity; it is also weakly sensitive to the transverse size of a real synchrotron radiation source. The experimental setup may be rather compact and provide image magnification by a factor of more than 100.
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Funding
This study was supported by the Russian Foundation for Basic Research, project no. 19-29-12043mk, in the part concerning the development of the computer program and by the Ministry of Science and Higher Education of the Russian Federation (grant no. 075-15-2021-1362) in the part of carrying out of a computer experiment and analysis of the results.
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Translated by Yu. Sin’kov
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Kohn, V.G. X-Ray Phase-Contrast Microscope: Theory and Computer Experiment. Crystallogr. Rep. 67, 826–832 (2022). https://doi.org/10.1134/S106377452206013X
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DOI: https://doi.org/10.1134/S106377452206013X