Theoretical analysis of the possibilities of Zernike phase contrast method in hard X rays for nondestructive imaging of micropipes in a silicon carbide single crystal

Abstract

The possibilities of using Zernike phase contrast in hard X rays for imaging micropipes in a silicon carbide single crystal are analyzed by numerical simulation. Calculations are performed for the experimental conditions characteristic of third-generation synchrotron radiation sources. A scheme is considered where the focusing element is a parabolic refracting lens and the phase-shifting element is mounted at the point of the source image. It is shown that micropipe cross sections by a beam with a longitudinal diameter reaching 10 μm are imaged by the lens without distortions. At the same time, the lens makes it possible to magnify the image several tens of times. The cross sections that are significantly elongated along the beam are imaged with artifacts; however, their structure can also be recovered. It is shown that polychromaticity of radiation does not significantly affect the object imaging.