Skip to main content
SpringerLink
Log in

Effect of broadening the discrete levels of the granule on the character of the current-voltage characteristic of a single-electron diode

  • Dynamics of Technological Processes
  • Published:
Russian Microelectronics Aims and scope Submit manuscript

Abstract

The effect of broadening the levels of the nanodisc electrode on the character of the current-volt-age characteristic of the three-electrode structure is investigated. The evaluation of broadening the electron levels in disc-like gold clusters is based on the tunnel effect of localized electrons in the presence of the bias voltage and in the presence of the Coulomb blockade. At low temperatures, the broadening effect leads to a strong smoothing of the current-voltage characteristic even in the structures based on clusters that consist of tens of atoms, which is observed experimentally.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. von Delft, J. and Ralph, D.C., Spectroscopy of Discrete Energy Levels in Ultrasmall Metallic Grains, Phys. Rep., 2001, vol. 345, nos. 2–3, pp. 61–173.

    Article  MATH  Google Scholar 

  2. Gubin, S.P., Gulayev, Yu.V., Khomutov, G.B., Kislov, V.V., Kolesov, V.V., Soldatov, E.S., Sulaimankulov, K.S., and Trifonov, A.S., Molecular Clusters as Building Blocks for Nanoelectronics: the First Demonstration of a Cluster Single-Electron Tunneling Transistor at Room Temperature, Nanotecnology, 2002, vol. 13, pp. 85–194.

    Article  Google Scholar 

  3. Wang, B., Xiao, X., Huang, X., Hou, J.G., and Sheng, P., Single-Electron Tunneling of Two-Dimensional Gold Clusters, Appl. Phys. Lett., 2000, vol. 77, no. 8, pp. 1179–1181.

    Article  Google Scholar 

  4. Hou, J.G., Wang, B., Yang, J., Wang, XR., Wang, H.Q., Zhu, Q., and Xiao, X., Nonclassical Behavior in the Capacitance of a Nanojunction, Phys. Rev. Lett., 2001, vol. 86, no. 23, pp. 5321–5324.

    Article  Google Scholar 

  5. Pogosov, V.V. and Vasyutin, E.V., Effects of Charging and Tunneling in Structure Based on Magic and Nonmagic Metal Clusters, Nanotecnology, 2006, vol. 17, pp. 3366–3374.

    Article  Google Scholar 

  6. Pogosov, V.V., Vasyutin, E.V., and Babich, A.V., Effect of Overheating on the Tunnel Current of a Molecular Transistor, Pis’ma Zh. Tekh. Fiz., 2007, vol. 33, pp. 1–10.

    Google Scholar 

  7. Lazarenkova, O.L. and Pikhtin, A.N., Energy Spectrum of Nonideal Quantum Well in the Electric Field, Fiz. Tekh. Poluprovodn. (S.-Peterburg), 1998, vol. 32, no. 9, pp. 1108–1113.

    Google Scholar 

  8. Baz, A.I., Zeldovich, Ya.B., and Perelomov, A.M., Rasseyanie, reaktsii i raspady v nerelyativistskoi kvantovoi mekhanike (Scattering, Reactions, and Decays in Nonrelativistic Quantum Mechanics), Moscow: Nauka, 1971.

    Google Scholar 

  9. Tunnel’nye yavleniya v tverdykh telakh: (Tunnel Phenomena in Solids), Burshteyn, E. and Lundquist, S., Eds., New York: Plenum, 1969; Moscow: Mir, 1973.

    Google Scholar 

  10. Azbel’, M.Ya., Time, Tunneling, and Turbulency, Usp. Fiz. Nauk, 1998, vol. 168, no. 6, pp. 613–623.

    Article  Google Scholar 

  11. Pozdnyakov, D.V. and Borzdov, V.M., Intensity of Intersubband Electron Scattering by Polar Optical Phonons in Semiconductor Quantum Wires with Account of Energy Level Broadening, Fiz. Tverd. Tela, 2003, vol. 45, no. 12, pp. 2238–2241 [Phys. Sol. State (Engl. Transl., 2003, vol. 45, no. 12, pp. 2248–2251].

    Google Scholar 

  12. Ohgi, T., Sheng, H.-Y., Dong, Z.-C., Nejoh, H., and Fujita, D., Charging Effects in Gold Nanoclusters Grown on Octanedithiol Layers, Appl. Phys. Lett., 2001, vol. 79, no. 15, pp. 2453–2455.

    Article  Google Scholar 

  13. Imamura, H., Chiba, J., Mitani, S., Takanashi, K., Takahashi, S., Maekawa, S., and Fujimori, H., Coulomb Staircase in STM Current Through Granular Films, Phys. Rev., B:, 2000, vol. 61, no. 1, pp. 46–49.

    Article  Google Scholar 

  14. Vasyutin, E.V. and Pogosov, V.V., Coulomb Instability of Charged Clusters, Fiz. Tverd. Tela, 2004, vol. 46, no. 10, pp. 1861–1865 [Phys. Sol. State (Engl. Transl.), 2004, vol. 46, no. 11, pp. 1927–1932.

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Zaporozh’e National Technical University, ul. Zhukovskogo 64, Zaporozh’e, 69063, Ukraine

    A. V. Babich, V. V. Pogosov, A. M. Baginskii, N. N. Nagornaya & A. G. Kravtsova

Authors
  1. A. V. Babich
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. V. V. Pogosov
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. A. M. Baginskii
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. N. N. Nagornaya
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. A. G. Kravtsova
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to V. V. Pogosov.

Additional information

Original Russian Text © A.V. Babich, V.V. Pogosov, A.M. Baginskii, N.N. Nagornaya, A.G. Kravtsova, 2010, published in Mikroelektronika, 2010, Vol. 39, No. 3, pp. 195–201.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Babich, A.V., Pogosov, V.V., Baginskii, A.M. et al. Effect of broadening the discrete levels of the granule on the character of the current-voltage characteristic of a single-electron diode. Russ Microelectron 39, 175–181 (2010). https://doi.org/10.1134/S1063739710030042

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S1063739710030042

Keywords

Search

Navigation