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System based on a ZVA-67 vector network analyzer for measuring high-frequency parameters of magnetic film structures

  • Magnetic Methods
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Russian Journal of Nondestructive Testing Aims and scope Submit manuscript

Abstract

Thin magnetic films and multilayers are widely used in electronic devices and sensor systems, including systems for magnetic nondestructive testing and magnetic biodetection. Creating sensing elements of a new generation will necessitate the certification of film nanostructures. In this paper, a novel system is presented that allows automated measurement of parameters of thin ferromagnetic film structures at frequencies of 0.1 to 25 GHz in a magnetic field of up to 18 kOe.

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Authors and Affiliations

  1. Ural Federal University, Yekaterinburg, 620002, Russia

    S. V. Shcherbinin, S. O. Volchkov, V. N. Lepalovskii, A. A. Chlenova & G. V. Kurlyandskaya

  2. Institute of Electrophysics, Ural Branch, Russian Academy of Sciences, Ekaterinburg, 620016, Russia

    S. V. Shcherbinin

Authors
  1. S. V. Shcherbinin
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  2. S. O. Volchkov
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  3. V. N. Lepalovskii
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  4. A. A. Chlenova
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  5. G. V. Kurlyandskaya
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Correspondence to S. V. Shcherbinin.

Additional information

Original Russian Text © S.V. Shcherbinin, S.O. Volchkov, V.N. Lepalovskii, A.A. Chlenova, G.V. Kurlyandskaya, 2017, published in Defektoskopiya, 2017, No. 3, pp. 41–49.

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Shcherbinin, S.V., Volchkov, S.O., Lepalovskii, V.N. et al. System based on a ZVA-67 vector network analyzer for measuring high-frequency parameters of magnetic film structures. Russ J Nondestruct Test 53, 204–212 (2017). https://doi.org/10.1134/S1061830917030093

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  • DOI: https://doi.org/10.1134/S1061830917030093

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