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Design of a soft X-ray and extreme UV reflectometer equipped with a high-resolution monochromator and high-brightness laser-plasma radiation source

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Abstract

The design of a reflectometer intended for investigating the reflection and transmission coefficients of components of X-ray optics in the wavelength range of 1–25 nm is described. A Czerny-Turner spectrometer with a planar diffraction grating and parabolic collimators is employed to monochromatize the radiation. The required geometry of the monochromatic probe beam is ensured by means of a toroidal mirror. The X-ray source is laser plasma. The expected average spectral radiation power on the sample under study is on the order of 107 photon/s in the spectral band 0.1 nm. A goniometer provides five and two degrees of freedom of the sample 500 mm in diameter and detector, respectively.

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Correspondence to N. I. Chkhalo.

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Original Russian Text © V.O. Dogadin, S.Yu. Zuev, N.N. Salashchenko, N.I. Chkhalo, A.V. Shcherbakov, 2015, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, 2015, No. 7, pp. 77–86.

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Dogadin, V.O., Zuev, S.Y., Salashchenko, N.N. et al. Design of a soft X-ray and extreme UV reflectometer equipped with a high-resolution monochromator and high-brightness laser-plasma radiation source. J. Surf. Investig. 9, 726–734 (2015). https://doi.org/10.1134/S1027451015040072

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  • DOI: https://doi.org/10.1134/S1027451015040072

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