Abstract
The results of studying Fe/Si and Si/Fe layered structures with different thicknesses of the top layer by reflected electron energy loss spectroscopy are presented. A new method is proposed for the estimation of volume fractions of components in binary systems within the framework of the effective dielectric medium model.
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Original Russian Text © A.S. Parshin, G.A. Aleksandrova, S.N. Varnakov, S.A. Kushchenkov, S.G. Ovchinnikov, 2007, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, No. 8, pp. 33–36.
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Parshin, A.S., Aleksandrova, G.A., Varnakov, S.N. et al. Study of Fe/Si magnetic layered nanostructures by reflected electron energy loss spectroscopy. J. Surf. Investig. 1, 462–465 (2007). https://doi.org/10.1134/S1027451007040179
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DOI: https://doi.org/10.1134/S1027451007040179