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Lithium intercalation into amorphous-silicon thin films: An electrochemical-impedance study

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Abstract

Lithium intercalation into 0.25-μm-thick films of amorphous silicon is studied using the electrochemical-impedance technique. An equivalent circuit, proposed for such electrodes, comprises the electrolyte resistance and three units connected in series, each unit being a parallel combination of a resistance and a constant-phase element. The units relate to the charge transfer processes at the silicon/electrolyte interface, charge transfer though the passive film on the silicon, and the lithium diffusion into the silicon bulk. During potential cycling, changes occur largely in the unit related to the passive film. The lithium diffusion coefficient in the amorphous silicon is estimated as ∼ 10−13 cm2 s−1.

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Correspondence to T. L. Kulova.

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Original Russian Text © T.L. Kulova, Yu.V. Pleskov, A.M. Skundin, E.I. Terukov, O.I. Kon’kov, 2006, published in Elektrokhimiya, 2006, Vol. 42, No. 7, pp. 791–798.

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Kulova, T.L., Pleskov, Y.V., Skundin, A.M. et al. Lithium intercalation into amorphous-silicon thin films: An electrochemical-impedance study. Russ J Electrochem 42, 708–714 (2006). https://doi.org/10.1134/S1023193506070032

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  • DOI: https://doi.org/10.1134/S1023193506070032

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