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Fluorescent X-ray transport in microchannel plates

  • Atoms, Spectra, Radiations
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Abstract

The X-ray absorption spectra of microchannel plates have been measured at grazing incidence of the primary radiation. The Si L components of X-ray absorption near-edge structure (XANES) spectra exhibit specific features for incident angles below a certain critical value. In order to explain the experimental data, a mechanism of selective X-ray fluorescence transport via microchannels is proposed, which is based on the notion of anomalous dispersion in the vicinity of the Si L absorption edge.

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Authors and Affiliations

  1. Rostov State University, Rostov-on-Don, 344090, Russia

    M. I. Mazuritskiy

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  1. M. I. Mazuritskiy
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Original Russian Text © M.I. Mazuritskiy, 2006, published in Pis’ma v Zhurnal Éksperimental’noĭ i Teoreticheskoĭ, 2006, Vol. 84, No. 7, pp. 455–458.

This author has also appeared under the alternate spelling M.I. Mazuritskii.

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Mazuritskiy, M.I. Fluorescent X-ray transport in microchannel plates. Jetp Lett. 84, 381–383 (2006). https://doi.org/10.1134/S0021364006190052

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  • DOI: https://doi.org/10.1134/S0021364006190052

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