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A Multichannel Detector for Monitoring the Degradation of Scintillation and Semiconductor Detectors in Low-Intensity Heavy-Ion Beams

  • NUCLEAR EXPERIMENT TECHNIQUE
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Abstract—

The description of detectors based on measuring the secondary-emission current and results of their tests are presented. Multichannel profilometers with a range of n × 103 to 109 ions/(cm2 s) have been created. This range is largely overlapped with the range from a few units to 106 ions/(cm2 s), which is characteristic of scintillation and semiconductor detectors. Current profilometers are used in the region of the overlap to monitor their degradation under exposure to the beam. The current profilometers are used in the transit of low-intensity beams, and their sensitivity is higher than the sensitivity of Al2O3 phosphors and Faraday cups by four orders of magnitude. A three-lamel probe has been created based on the secondary emission to measure the current of the internal accelerator beam with a lower-range value of 0.1 pA.

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REFERENCES

  1. Revenko, R.V., Vin’e, Zh.-L., Isataev, T., Luk’yanov, S.M., Mendibaev, K., Pansin, L., and Penionzhkevich, Yu.E., Preprint of Joint Institute for Nuclear Research, Dubna, 2017, no. R7-2017-58.

  2. Harasimowicz, J., Welsch, C.P., Cosentino, L., Pappalardo, A., and Finocchiaro, P., Phys. Rev. Spec. Top.–Accel. Beams, 2012, vol. 15, p. 122801. https://doi.org/10.1103/PhysRevSTAB.15.122801

    Article  ADS  Google Scholar 

  3. Skuratov, V.A., Anashin, V.S., Chlenov, A.M., Emeliyanov, V.V., Gikal, B.N., Gulbekyan, G.G., Kalagin, I.V., Milovanov, Y.A., Teterev, Yu.G., and Kazacha, V.I., Proc. 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sevilla, 2011, p. 756. https://doi.org/10.1109/RADECS.2011.6131461.

  4. Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation, EIA/JEDEC STANDARD, EIA/JESD57, Electronic Industries Association, 1996.

  5. Mitrofanov, A.V., Apel, P.Yu., Blonskaya, I.V., and Orelovich, O.L., Tech. Phys., 2006, vol. 51, no. 9, p. 1229.

    Article  Google Scholar 

  6. http://smartbox.jinr.ru/smartbox6.php?select=2103#ii162.

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Authors and Affiliations

  1. Joint Institute for Nuclear Research, Flerov Laboratory of Nuclear Reactions, 141980, Dubna, Moscow oblast, Russia

    Yu. G. Teterev, A. I. Krylov, A. T. Issatov & S. V. Mitrofanov

  2. Gumilyov Eurasian National University, 010000, Nur-Sultan, Kazakhstan

    A. T. Issatov

Authors
  1. Yu. G. Teterev
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  2. A. I. Krylov
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  3. A. T. Issatov
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  4. S. V. Mitrofanov
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Corresponding author

Correspondence to Yu. G. Teterev.

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Translated by N. Goryacheva

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Teterev, Y.G., Krylov, A.I., Issatov, A.T. et al. A Multichannel Detector for Monitoring the Degradation of Scintillation and Semiconductor Detectors in Low-Intensity Heavy-Ion Beams. Instrum Exp Tech 63, 334–338 (2020). https://doi.org/10.1134/S0020441220030057

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  • DOI: https://doi.org/10.1134/S0020441220030057

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