Abstract
The results of testing a prototype of a surface-barrier detector of charged particles based on single-crystal epitaxial layers of diamond are presented. Diamond films with p-type conduction with a boron concentration of (4–8) × 1014 cm–3 65 μm thick were grown using gas-phase deposition on heavily doped diamond substrates grown at high pressure and high temperature. A 17 mm2 Schottky barrier was formed by sputtering Pt with a thickness of 30 nm. When irradiated from the 238Pu α-source (the 5.499 keV line) a detector with an external bias of 90 V demonstrated a charge collection efficiency close to 100% and a FWHM high energy resolution of 0.56%. The obtained energy resolution is at the level of standard silicon detectors.
Similar content being viewed by others
REFERENCES
Pomorski, M., Berdermann, E., De Boer, W., Furgeri, A., Sander, C., and Morse, J., Diamond Relat. Mater., 2007, vol. 16, nos. 4–7, p. 1066. https://doi.org/10.1016/j.diamond.2006.11.016
Kumar, A., Kumar, A., Topkar, A., and Das, D., Nucl. Instrum. Methods Phys. Res., Sect. A, 2017, vol. 858, p. 12. https://doi.org/10.1016/j.nima.2017.03.033
Kumar, A. and Topkar, A., IEEE Trans. Nucl. Sci., 2018, vol. 65, no. 1, p. 630. https://doi.org/10.1109/TNS.2017.2783919
Hassard, J., Nucl. Instrum. Methods Phys. Res., Sect. A, 1995, vol. 368, no. 1, p. 217. https://doi.org/10.1109/TNS.2017.2783919
Seidel, S., J. Instrum., 2014, vol. 9, no. 01, p. C01013. https://doi.org/10.1088/1748-0221/9/01/C01013
Pomorski, M., Berdermann, E., Caragheorgheopol, A., Ciobanu, M., Kiš, M., Martemiyanov, A., Nebel, C., and Moritz, P., Phys. Status Solidi A, 2006, vol. 203, no. 12, p. 3152. https://doi.org/10.1002/pssa.200671127
Dueñas, J.A., de la Torre Pérez, J., Sánchez, A.M., and Martel, I., Appl. Radiat. Isot., 2014, vol. 90, p. 177. https://doi.org/10.1016/j.apradiso.2014.03.032
Marinelli, M., Milani, E., Prestopino, G., Scoccia, M., Tucciarone, A., Verona-Rinati, G., Angelone, M., Pillon, M., and Lattanzi, D., Appl. Phys. Lett., 2006, vol. 89, p. 143509. https://doi.org/10.1063/1.2356993
Bolshakov, A.P., Zyablyuk, K.N., Kolyubin, V.A., Dravin, V.A., Khmelnitskii, R.A., Nedosekin, P.G., Pashentsev, V.N., Tyurin, E.M., and Ralchenko, V.G., Nucl. Instrum. Methods Phys. Res., Sect. A, 2017, vol. 871, p. 142. https://doi.org/10.1016/j.nima.2017.07.058
Rebai, M., Milocco, A., Giacomelli, L., Cippo, E.P., Tardocchi, M., Fazzi, A., Pietropaolo, A., and Gorini, G., J. Instrum., 2013, vol. 8, no. 10, p. 10007. https://doi.org/10.1088/1748-0221/8/10/P10007
Osipenko, M., Ripani, M., Ricco, G., Caiffi, B., Pompili, F., Pillon, M., Verona-Rinati, G., and Cardarelli, R., Nucl. Instrum. Methods Phys. Res., Sect. A, 2016, vol. 817, p. 19. https://doi.org/10.1016/j.nima.2016.02.008
Ogasawara, K., Broiles, T.W., Coulter, K.E., Dayeh, M.A., Desai, M.I., Livi, S.A., McComas, D.J., and Walther, B.C., Nucl. Instrum. Methods Phys. Res., Sect. A, 2015, vol. 777, p. 131. https://doi.org/10.1016/j.nima.2014.12.098
Frégeau, M.O., Oberstedt, S., Brys, T., Gamboni, T., Geerts, W., Hambsch, F.J., Oberstedt, A., and Vidali, M., Nucl. Instrum. Methods Phys. Res., Sect. A, 2015, vol. 791, p. 58. https://doi.org/10.1016/j.nima.2015.04.030
Schirru, F., Chokheli, D., and Kiš, M., Diamond Relat. Mater., 2014, vol. 49, p. 96.
Bormashov, V.S., Tarelkin, S.A., Buga, S.G., Kuznetsov, M.S., Terentiev, S.A., Semenov, A.N., and Blank, V.D., Diamond Relat. Mater., 2013, vol. 35, p. 19. https://doi.org/10.1016/j.diamond.2013.02.011
Blank, V.D., Bormashov, V.S., Tarelkin, S.A., Buga, S.G., Kuznetsov, M.S., Teteruk, D.V., Kornilov, N.V., Terentiev, S.A., and Volkov, A.P., Diamond Relat. Mater., 2015, vol. 57, p. 32. https://doi.org/10.1016/j.diamond.2015.01.005
Tarelkin, S., Bormashov, V., Buga, S., Volkov, A., Teteruk, D., Kornilov, N., Kuznetsov, M., Terentiev, S., Golovanov, A., and Blank, V., Phys. Status Solidi A, 2015, vol. 212, no. 11, p. 2621. https://doi.org/10.1002/pssa.201532213
Sze, S.M. and Kwok, K.Ng., Physics of Semiconductor Devices, Hoboken, NJ: Wiley, 2007.
Breese, M.B.H., J. Appl. Phys., 1993, vol. 74, no. 6, p. 3789.
Author information
Authors and Affiliations
Corresponding author
Additional information
FINANCING
This work received financial support from the Ministry of Education and Science of the Russian Federation (Subsidy Grant Agreement no. 075-02-2018-210 dated November 26, 2018, unique identifier of the agreement RFMEFI57818X0266).
Rights and permissions
About this article
Cite this article
Chernykh, S.V., Tarelkin, S.A., Chernykh, A.V. et al. Testing of a Prototype Detector of Heavy Charged Particles Based on Diamond Epitaxial Films Obtained by Gas-Phase Deposition. Instrum Exp Tech 62, 473–479 (2019). https://doi.org/10.1134/S0020441219040158
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S0020441219040158