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Application of a Differential Polarization Interferometer for Measuring of the Optical Path Length in Thin Metamaterial Layers with Reflection and Absorption Losses

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Abstract

A differential polarization interferometer capable of correctly measuring the optical path length in thin metamaterial layers with absorption and reflection losses has been developed. As a result of direct measurement, it is shown that an Ag(28 nm)/SiO2(12 nm) binary layer deposited on a glass substrate is characterized by a negative refractive index in a wide range of incident angles of a laser beam with a wavelength of 632.8 nm.

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REFERENCES

  1. Veselago, V.G., Usp. Fiz. Nauk, 1967, vol. 92, no. 3, p. 517. https://doi.org/10.3367/UFNr.0092.196707d.0517

    Article  Google Scholar 

  2. Luo, C., Johnson, S.G., Joannopoulos, J.D., and Pendry, J.B., Phys. Rev. B, 2002, vol. 65, no. 20, p. 201104-1. https://doi.org/10.1103/PhysRevB.65.201104

    Article  ADS  Google Scholar 

  3. Foteinopoulou, S. and Soukoulis, C.M., Phys. Rev. B, 2003, vol. 67, no. 23, p. 235107-1. https://doi.org/10.1103/PhysRevB.67.235107

    Article  ADS  Google Scholar 

  4. Kuo, C.-H. and Ye, Z., Phys. Rev. E, 2004, vol. 70, no. 5, p. 056608-1. https://doi.org/10.1103/PhysRevE.70.056608

    Article  ADS  Google Scholar 

  5. Feng, S., Li, Z.-Y., Feng, Z.-F., Ren, K., Cheng, B.-Y., and Zhang, D.-Z., J. Appl. Phys., 2005, vol. 98, no. 6, p. 063102-1. https://doi.org/10.1063/1.2058190

    Article  ADS  Google Scholar 

  6. Belov, P.A. and Hao, Y., Phys. Rev. B, 2006, vol. 73, no. 11, p. 113110-1. https://doi.org/10.1103/PhysRevB.73.113110

    Article  ADS  Google Scholar 

  7. Veselago, V., Braginsky, L., Shklover, V., and Hafner, C., J. Comput. Theor. Nanosci., 2006, vol. 3, no. 2, p. 1. https://doi.org/10.1166/jctn.2006.002

    Article  Google Scholar 

  8. Shalaev, V.M., Cai, W., Chettiar, U.K., Yuan, H.-K., Sarychev, A.K., Drachev, V.P., and Kildishev, A.V., Opt. Lett., 2005, vol. 30, no. 24, p. 3356. https://doi.org/10.1364/OL.30.003356

    Article  ADS  Google Scholar 

  9. Drachev, V.P., Cai, W., Chettiar, U., Yuan, H.-K., Sarychev, A.K., Kildishev, A.V., Klimeck, G., and Shalaev, V.M., Laser Phys. Lett., 2006, vol. 3, no. 1, p. 49. https://doi.org/10.1002/lapl.200510062

    Article  ADS  Google Scholar 

  10. Agashkov, A.V., Kazak, N.S., Agabekov, V.E., Alshammari, M.S.O., and Binhussain, M.A., US Patent 9778019, 2017. https://patentimages.storage.googleapis.com/d9/a8/c6/af64e4ea53f693/US9778019.pdf.

  11. Agashkov, A.V., Kazak, N.S., Agabekov, V.E., Alshammari, M.S.O., and Binhussain, M.A., EU Patent 3054274, 2017. https://patentimages.storage.googleapis.com/d3/12/13/850f6fe9cce6cc/EP3054274A1.pdf.

  12. Kazak, N.S., Agashkov, A.V., Khilo, N.A., and Varanetskii, A.M., Dokl. Nats. Akad. Nauk Belarusi, 2016, vol. 60, no. 3, p. 43.

    Google Scholar 

  13. Refractive Index of In2O3–SnO2 (Indium Tin Oxide, ITO)–Konig. http://refractiveindex.info/?shelf=other &book=In2O3-SnO2&page=Konig.

  14. Agashkov, A.V., J. Opt. Technol., 2015, vol. 82, no. 1, p. 6. https://doi.org/10.1364/JOT.82.000006

    Article  Google Scholar 

  15. Agashkov, A.V., 6-oi Kongress fizikov Belarusi: Sbornik naucnykh trudov (Proc. 6th Congress of Physicists of Belarus), Minsk: Stepanov Institute of Physics, National Acad. Sci. of Belarus, 2017, p. 140. http://master.basnet.by/congress2017/VIkongress.pdf.

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ACKNOWLEDGMENTS

We are grateful to A.G. Smirnov for measuring the geometric thickness of films using the spectral ellipsometry method.

Funding

This work was supported in part by the contract no. KACST-IChNM-SIPH/01 and the Belarusian Republican Foundation for Basic Research (project no. F18AZ-003).

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Authors and Affiliations

  1. Stepanov Institute of Physics, National Academy of Sciences of Belarus, 220072, Minsk, Belarus

    A. V. Agashkov & N. S. Kazak

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  1. A. V. Agashkov
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  2. N. S. Kazak
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Correspondence to A. V. Agashkov.

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Translated by N. Goryacheva

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Agashkov, A.V., Kazak, N.S. Application of a Differential Polarization Interferometer for Measuring of the Optical Path Length in Thin Metamaterial Layers with Reflection and Absorption Losses. Instrum Exp Tech 62, 532–536 (2019). https://doi.org/10.1134/S0020441219040018

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  • DOI: https://doi.org/10.1134/S0020441219040018

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