Skip to main content
Log in

Four-probe methods for measuring the resistivity of samples in the form of rectangular parallelepipeds

  • General Experimental Techniques
  • Published:
Instruments and Experimental Techniques Aims and scope Submit manuscript

Abstract

The problem of measuring the resistivity of isotropic samples of finite dimensions in the form of rectangular parallelepipeds using the four-probe technique was considered. Two variants of contact arrangements were studied: (1) four collinear probes are positioned on one side of a sample symmetrically with respect to the other sides, and (2) two probes on one side of a sample and two on the opposite side are placed precisely in opposite positions and symmetrically with respect to the other sides of the sample (the Schnabel method). Solutions of the problem of the electric field potential distribution in a sample for different positions of the current contacts were found. The solutions were obtained in the form of double series and methods of their summation are presented. The obtained results are extended to the case of measuring the resistivity of anisotropic samples when the resistivity tensor has two independent components. The results of using the developed technique for measuring the resistivity of such a highly anisotropic material as highly oriented pyrolitic graphite using the Schnabel method are presented.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. Schnabel, P., Phillips Res. Rep., 1964, vol. 19, p. 43.

    Google Scholar 

  2. Schnabel, P., Zt. Ang. Phys., 1967, vol. 22, no. 2, p. 136.

    Google Scholar 

  3. Tikhonov, A.N. and Samarskii, A.A., Uravneniya matematicheskoi fiziki (Equations of Mathematical Physics), 7th ed., Moscow: Mos. Gos. Univ., 1999.

    Google Scholar 

  4. Pavlov, L.P., Metody izmereniya parametrov poluprovodnikovykh materialov (Methods for Measuring Parameters of Semiconductor Materials), Moscow: Vysshaya Shkola, 1987.

    Google Scholar 

  5. Hansen, E.B., Appl. Sci. Res., Sec. B, 1960, vol. 8, p. 93.

    Article  Google Scholar 

  6. Mircea, A., Solid-State Electron., 1963, vol. 6, p. 459.

    Article  ADS  Google Scholar 

  7. Kon’kov, V.L., Fiz. Tverd. Tela (St. Petersburg), 1964, vol. 6, p. 304.

    Google Scholar 

  8. Stephen, A.E., Mackey, H.J., and Sybert, J.R., J. Appl. Phys., 1971, vol. 42, p. 2592.

    Article  ADS  Google Scholar 

  9. Polyakov, N.N., Zh. Tekh. Fiz., 1991, vol. 61, no. 11, p. 79.

    Google Scholar 

  10. Lugansky, L.B. and Tsebro, V.I., in Chetyrekhzondovye metody izmereniya udel’nogo soprotivleniya (Four-Probe Methods of Resistivity Measurements), Moscow: Fiz. Inst. Akad. Nauk, 2012.

    Google Scholar 

  11. Van der Pauw, L.J., Phillips Res. Rep., 1961, vol. 16, p. 187.

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to L. B. Lugansky.

Additional information

Original Russian Text © L.B. Lugansky, V.I. Tsebro, 2015, published in Pribory i Tekhnika Eksperimenta, 2015, No. 1, pp. 122–133.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Lugansky, L.B., Tsebro, V.I. Four-probe methods for measuring the resistivity of samples in the form of rectangular parallelepipeds. Instrum Exp Tech 58, 118–129 (2015). https://doi.org/10.1134/S0020441215010200

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S0020441215010200

Keywords

Navigation