Abstract
It has been theoretically and experimentally shown that, using stepwise rotation of a multielectrode free-air ionization chamber to measure the parameters of a pulsed proton beam, it is possible to substantially increase the accuracy in determining both the centroid position of the beam cross section, as well as the transverse distribution of the dose produced by the beam. The linear operation modes of the chambers are identified and the system characteristics are investigated. The inaccuracy in determining the centroid position of the beam cross section is <2% (∼0.4 mm), which confirms the applicability of the method for beam monitoring.
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Khoroshkov, V.S., Vvedenie v tekhniku protonnoi luchevoi terapii (Introduction into Proton Therapy Technique), Moscow: Uchebn.-Nauchn. Tsentr Dovuz. Obraz., 2001.
Klenov, G.I. and Khoroshkov, V.S., Med. Fiz., 2005, no. 3, p. 16.
Klenov, G.I. and Khoroshkov, V.S., Med. Fiz., 2005, no. 4, p. 9.
Khoroshkov, V.S., Phys. At. Nucl., 2006, vol. 69, no. 10, p. 1724.
Chu, W.T., Ludewigt, G.A., and Renner, T.R., Rev. Sci. Instrum., 1993, vol. 64, p. 2055.
Poppea, B., Blechschmidt, A., and Djouguela, A., Med. Phys., 2006, vol. 33, no. 4, p. 1005.
Nishio, T., Kataoka, S., Tachibana, M., Matsumura, K., Uzawa, N., Saito, H., Sasano, T., Yamaguchi, M., and Ogino, T., Phys. Med. Biol., 2006, vol. 51, p. 1249.
Press, W.H., Teukolsky, S.A., Vetterling, W.T., and Flannery, B.P., Numerical Recipes in Fortran, Cambridge: Cambridge University, 1992, 2nd ed.
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Original Russian Text © D.A. Zhidkov, V.I. Kostyuchenko, M.F. Lomanov, O.B. Ryazantsev, V.S. Khoroshkov, 2015, published in Pribory i Tekhnika Eksperimenta, 2015, No. 1, pp. 151–158.
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Zhidkov, D.A., Kostyuchenko, V.I., Lomanov, M.F. et al. Monitoring of pulsed proton beams using free-air ionization chambers with petal shape electrodes. Instrum Exp Tech 58, 146–152 (2015). https://doi.org/10.1134/S0020441214060177
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DOI: https://doi.org/10.1134/S0020441214060177