Abstract
The design of a sample holder for a variable temperature scanning tunneling microscope (VT STM (Omicron)) with a variable sample temperature is described. This design considerably extends the range of investigated materials whose surface structure is sensitive to low concentrations of contaminations. The device is manufactured on the basis of the components of a standard holder with the possibility of heat-treating samples in a temperature range of 100–1500 K. The working capacity of the modified sample holder was demonstrated for an example of obtaining a Si(100)−2 × 1 surface with an ultimately low concentration of structural defects.
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Original Russian Text © V.G. Kotlyar, B.K. Churusov, D.A. Olyanich, T.V. Utas, D.V. Gruznev, A.V. Zotov, A.A. Saranin, 2013, published in Pribory i Tekhnika Eksperimenta, 2013, No. 6, pp. 105–109.
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Kotlyar, V.G., Churusov, B.K., Olyanich, D.A. et al. Modification of the sample holder for a variable temperature scanning tunneling microscope (Omicron). Instrum Exp Tech 56, 745–748 (2013). https://doi.org/10.1134/S0020441213050187
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DOI: https://doi.org/10.1134/S0020441213050187