Abstract
Methods for measuring the resistivity of materials during elastic and elastoplastic interactions of a current-conducting indenter and a studied sample are described. Analytical methods that describe the dependences of the contact ohmic resistance on the pressure force and the contact stiffness are proposed. The considered models are experimentally tested with a NanoScan scanning nanohardness tester using indenters made of boron-doped diamond single crystals.
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Original Russian Text © A.I. Soshnikov, K.S. Kravchuk, I.I. Maslenikov, D.V. Ovchinnikov, V.N. Reshetov, 2013, published in Pribory i Tekhnika Eksperimenta, 2013, No. 1, pp. 120–126.
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Soshnikov, A.I., Kravchuk, K.S., Maslenikov, I.I. et al. Measuring the local resistivity by the nanoindentation and force-spectroscopy methods. Instrum Exp Tech 56, 233–239 (2013). https://doi.org/10.1134/S0020441213020115
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DOI: https://doi.org/10.1134/S0020441213020115