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Absolute calibration of X-ray optical elements and detectors at a wavelength of 46.9 nm

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Abstract

The results are presented of the absolute calibration of X-ray optical elements (diffraction gratings and Sc/Si multilayers) and detectors (an УΦ-4 photographic film and a vacuum X-ray diode) used in diagnostic devices to study generation of X-ray laser radiation in an argon plasma of a capillary discharge (λ = 46.9 nm). The measurements have been performed at the soft X-ray and vacuum UV station of the VEPP-4 storage ring at the Siberian International Center of Synchrotron Radiation. An absolutely calibrated AXUV 100G photodiode has been used as a reference detector. The relative error of calibration is 10%. The measured reflectances of the multilayer mirrors and gratings are in good agreement (within the limits of errors) with the results of their calibration at the RKK-1-100 X-ray calibration facility.

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Authors and Affiliations

  1. Zababakhin All-Russia Research Institute of Technical Physics, Russian Federal Nuclear Center, ul. Vasil’eva 13, Snezhinsk, Chelyabinsk oblast, 456770, Russia

    O. N. Gilev & D. A. Vikhlyaev

  2. Budker Institute of Nuclear Physics, Siberian Division, Russian Academy of Sciences, pr. Akademika Lavrent’eva 11, Novosibirsk, 630090, Russia

    A. A. Legkodymov & A. D. Nikolenko

Authors
  1. O. N. Gilev
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  2. D. A. Vikhlyaev
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  3. A. A. Legkodymov
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  4. A. D. Nikolenko
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Additional information

Original Russian Text © O.N. Gilev, D.A. Vikhlyaev, A.A. Legkodymov, A.D. Nikolenko, 2010, published in Pribory i Tekhnika Eksperimenta, 2010, No. 6, pp. 107–110.

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Gilev, O.N., Vikhlyaev, D.A., Legkodymov, A.A. et al. Absolute calibration of X-ray optical elements and detectors at a wavelength of 46.9 nm. Instrum Exp Tech 53, 873–876 (2010). https://doi.org/10.1134/S0020441210060199

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  • DOI: https://doi.org/10.1134/S0020441210060199

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