Abstract
An experimental setup and procedure for measuring electrodynamic characteristics of planar periodic metal-dielectric structures, which can be used for manufacturing practical equipment operating in millimeter, submillimeter, and terahertz wavelength ranges. Serviceability of the setup is checked by comparing the waveguide and spatial characteristics obtained experimentally and by numerical methods in a 4-mm wavelength range.
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Vorob’ev, G.S., Petrovskii, M.V., and Krivets, A.S., Izv. Vyssh. Uchebn. Zaved., Radioelektronika, 2006, vol. 49, no. 7, p. 56.
Vorob’ev, G.S., Petrovskii, M.V., Ruban, A.I., et al., Telecommunications and Radio Engineering, 2007, no. 66, no. 20, p. 1839.
Vorob’ev, G.S., Petrovskii, M.V., Zhurba, V.O., et al., Khar’kovskaya nanotekhnologicheskaya assambleya-2007 (Khar’kov Nanotechnological Assembly-2007), Kharkov, 2007, vol. 2, p. 133.
Generatory difraktsionnogo izlucheniya (Diffraction Radiation Generators), Shestopalov, V.P., Ed., Kiev: Naukova Dumka, 1991.
Vorob’ev, G.S., Petrovskii, M.V., Tsvyk, A.I., et al., Vestnik Sumskogo Gosuniver. Ser. Fizika, Math., Mekh., 2005, no. 4 (76), p. 159.
Shestopalov, V.P., Fizicheskie osnovy millimetrovoi i submillimetrovoi tekhniki. T. 1.: Otkrytye struktury (Physical Grounds of Millimetric and Submillimetric Technique. Vol. 1: Open Structures), Kiev: Naukova Dumka, 1985.
Bankov, S.E., Kurushin, A.A., and Razevig, V.D., Analiz i optimizatsiya trekhmernykh SVCh-struktur s pomoshch’yu HFSS (Analysis and Optimization of Three-Dimensional Structures by the HFSS), Moscow: SOLON-Press, 2004.
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Original Russian Text © G.S. Vorobjev, V.O. Zhurba, M.V. Petrovsky, A.A. Rybalko, 2010, published in Pribory i Tekhnika Eksperimenta, 2010, No. 4, pp. 74–76.
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Vorobjev, G.S., Zhurba, V.O., Petrovsky, M.V. et al. A setup for measuring spatial and waveguide characteristics of periodic metal-dielectric structures. Instrum Exp Tech 53, 536–538 (2010). https://doi.org/10.1134/S0020441210040111
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DOI: https://doi.org/10.1134/S0020441210040111