Abstract
An ultrahigh vacuum device for measuring the conductivity of surface structures based on a closed-cycle refrigerator is described. The device allows measurements of the conductivity of surface atomic structures as a function of the temperature (in the range 22—300 K) and electric field. The circuit for conductivity measurements allows operation with contact resistances of up to 1010 Ω and currents as low as 10-13A. The operation of the device is demonstrated by an example of measuring the conductivity of a clean reconstructed Si(111)7 - 7 surface.
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Losio, R., Altmann, K.N., Kirakosian, A., et al., Phys. Rev. Lett., 2001, vol. 86, p. 4632.
Himpsel, F.J., Kirakosian, A., Crain, J.N., et al., Solid State Comm., 2001, vol. 117, p. 149.
Crain, J.N., Altmann, K.N., Bromberger, C., and Himpsel, F.J., Phys. Rev. B:, 2002, vol. 66, p. 205302.
Lee, G., Guo, J., and Plummer, E.W., Phys. Rev. Lett., 2005, vol. 95, p. 116103.
Shiraki, I., Tanabe, F., Hobara, R., et al., Surf. Sci., 2001, vol. 493, p. 633.
Hobra, R., Nagamura, N., and Hasegawa, S., Rev. Sci. Instrum., 2007, vol. 78, p. 053705.
Tanikawa, T., Matsuda, I., Hobara, R., and Hasegawa, S., Surf. Sci. Nanotech., 2003, vol. 1, p. 50.
Wells, J.W., Kallehauge, J.F, Hansen, T.M., and Hofman, Ph., Phys. Rev. Lett., 2006, vol. 97, p. 206803.
Hasegawa, S. and Grey, F., Surf. Sci., 2002, vol. 500, p. 84.
Losio, R., Altmann, K.N., and Himpsel, F.J., Phys. Rev. B, 2000, vol. 61, p. 10845.
Ortega, J., Flores, F., and Yeyati, A.L., Phys. Rev. B, 1998, vol. 58, p. 4584.
Tanikawa, T., Yoo, K., Matsuda, I., and Hasegawa, S., Phys. Rev. B, 2003, vol. 68, p. 113303.
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Original Russian Text © A.B. Odobesco, B.A. Loginov, V.B. Loginov, V.F. Nasretdinova, S. V. Zaitsev-Zotov, 2010, published in Pribory i Tekhnika Eksperimenta, 2010, No. 3, pp. 152–158.
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Odobesco, A.B., Loginov, B.A., Loginov, V.B. et al. An ultrahigh vacuum device for measuring the conductivity of surface structures by a four-probe method based on a closed-cycle refrigerator. Instrum Exp Tech 53, 461–467 (2010). https://doi.org/10.1134/S0020441210030267
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DOI: https://doi.org/10.1134/S0020441210030267