Abstract
The shape of the resolution function and the predicted and earlier detected pseudopeak in the diffraction reflection curve (DRC) were experimentally studied in detail as functions of the geometric parameters of a double-crystal dispersion-free measurement system. It has been established that the shapes of the resolution function and the pseudopeak in the DRC weakly depend on the width of the collimation slit so that this optical element, which was earlier considered necessary, is extraneous in this measurement scheme. The physical mechanism of the formation of a pseudopeak in the DRC is illustrated by the example of analyzing the Du Mond diagram.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
Tapfer, L. and Ploog, K., Phys. Rev., 1989, vol. 40, p. 9802.
Bocchi, C. and Ferrari, C., J. Phys. D: Appl. Phys, 1995, vol. 28, p. A164.
Fischer, G. and Zaumseil, P., J. Phys. D: Appl. Phys, 1995, vol. 28, p. A109.
Tapfer L. and Ploog K., Phys. Rev. B, 1989, vol. 40, p. 9802.
Afanas’ev, A.M., Chuev, M.A., Imamov, R.M., et al., Kristallografiya, 1997, vol. 42, no. 3, p. 514 [Crystallogr. Rep. (Engl. Transl.), vol. 42, no. 3].
Pashaev, E.M., Yakunin, S.N., Zaitsev, A.A., et al., Phys. Status Solidi A, 2003, vol. 195, p. 204.
Aronzon, B.A., Kovalchuk, M.V., Pashaev, E.M., et al., J. of Physics: Condensed Matter, 2008, vol. 20, no. 145 207.
Chuev, M.A., Aronzon, B.A., Pashaev, E.M., et al., Mikroelektronika, 2008, vol. 37, no. 2, p. 83.
James, R.W., The Optical Principle of the Diffraction of X rays, London: Bell, 1950.
Bouen, D.K. and Tanner, B.K., Vysokorazreshayushchaya rentgenovskaya difraktometriya i topografiya (High-Resolution X-ray Diffractometry and Topography), St. Petersburg: Nauka, 2002.
Chuev, M.A., Pashaev, E.M., Kvardakov, V.V., and Subbotin, I.A., Kristallografiya, 2008, vol. 53, no. 5, p. 780 [Crystallogr. Rep. (Engl. Transl.), vol. 53, no. 5, p. ].
DuMond, J.W.M., Phys. Rev., 1937, vol. 52, p. 872.
Mirkin, L.I., Spravochnik po rentgenostrukturnomu analizu polikristallov (Handbook on X-ray Diffraction Analysis of Polycrystals), Moscow: Fizmatgiz, 1961.
Afanas’ev, A.M., Chuev, M.A., Imamov, R.M., and Lomov, A.A., Kristallografiya, 2001, vol. 46, no. 5, p. 781 [Crystallogr. Rep. (Engl. Transl.), vol. 46, no. 5].
Afanas’ev, A.M., Chuev, M.A., Imamov, R.M., et al., Pis’ma Zh. Eksp. Teor. Fiz., 2001, vol. 74, no. 10, p. 560.
Chuev, M.A., Afanas’ev, A.M., Imamov, R.M., et al., Proc. of SPIE, 2004, vol. 5401, p. 543.
Vegard, L.Z., Z. Phys. A Hadrons and Nuclei, 1921, vol. 5, nos. 5–6, p. 393.
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © E.M. Pashaev, I.A. Subbotin, M.A. Chuev, V.V. Kvardakov, A.E. Golovanov, I.A. Likhachev, 2009, published in Pribory i Tekhnika Eksperimenta, 2009, No. 5, pp. 107–115.
Rights and permissions
About this article
Cite this article
Pashaev, E.M., Subbotin, I.A., Chuev, M.A. et al. The resolution function of a double-crystal X-ray diffractometer. Instrum Exp Tech 52, 712–720 (2009). https://doi.org/10.1134/S0020441209050133
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S0020441209050133