Abstract
An instrument intended for measuring small nonlinearities of the volt-ampere characteristics of metal-semiconductor-metal tunneling junctions at helium temperatures is described. The spectrometer contains a controlled scan unit and four 24-bit channels for measuring the current, the real and imaginary components of the first derivative of the volt-ampere characteristic (the conductivity), and the second derivate. The derivatives sensitivity of the spectrometer is 10−6, and the dynamic range in measuring the current is 116 dB. Physically, the spectrometer is a single unit with an interface to the computer USB port.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
Zhitnitskii, E.A. and Zakharov, A.A., Prib. Tekh. Eksp., 1992, no. 4, p. 197.
Kolla, E.V., Prib. Tekh. Eksp., 1977, no. 3, p. 203.
Dizhur, E.M. and Fedorov, A.V., Prib. Tekh. Eksp., 2005, no. 4, p. 38 [Instrum. Exp. Teh. (Engl.Transl.), 2005, no. 4, p. 455].
Author information
Authors and Affiliations
Additional information
Original Russian Text © V.N. V’yukhin, Yu.A. Popov, 2009, published in Pribory i Tekhnika Eksperimenta, 2009, No. 4, pp. 98–101.