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Application of selective chemical reactions in atomic force microscopy for obtaining information on the local physicochemical surface structure of polymeric materials

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Abstract

A technique for obtaining information on the local chemical surface structure of polymeric materials that involves the chemical force microscopy and X-ray photoelectron spectroscopy methods combined with selective chemical reactions is described. Maps of the force of adhesion of the probe to an area of the surface of a pentane-based plasma-polymerized coating before and after its modification with a selective reagent with an area resolution of 36 nm2 are plotted. The adhesion force changes in the range 3.2–7.4 nN. It has been established that hydroxyl groups on the studied surface are located predominantly along topographic folds on the film surface.

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Original Russian Text © S.G. Bystrov, 2009, published in Pribory i Tekhnika Eksperimenta, 2009, No. 2, pp. 153–158.

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Bystrov, S.G. Application of selective chemical reactions in atomic force microscopy for obtaining information on the local physicochemical surface structure of polymeric materials. Instrum Exp Tech 52, 295–300 (2009). https://doi.org/10.1134/S0020441209020328

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  • DOI: https://doi.org/10.1134/S0020441209020328

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