Abstract
A scanner for an ultrahigh-vacuum low-temperature scanning tunneling microscope is described. It has a high resonance frequency (>30 kHz) and a small thermal-drift rate (≤1 nm/°C) at room temperature. The scanner feeds the tip to the sample at a distance of up to 3 mm and positions it in the sample plane on a 4 × 4-mm area. These characteristics of the scanner allow one to study atomic structures at temperature variations from 5 to 300 K with objects under study remaining in view of the microscope. The scanner has a horizontal attachment for a sample with a size of up to 6 × 6 × 3mm and ensures a scanning field of 4.8 × 4.8 × 0.6 μm at 300 K and 0.8 × 0.8 × 0.1 μm at 5 K, as well as the possibility of heating to 150°C and easily replacing the sample and tip with vacuum manipulators.
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Original Russian Text © B.A. Loginov, K.N. El’tsov, S.V. Zaitsev-Zotov, A. N. Klimov, V.M. Shevlyuga, 2007, published in Pribory i Tekhnika Eksperimenta, 2007, No. 3, pp. 148–149.
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Loginov, B.A., El’tsov, K.N., Zaitsev-Zotov, S.V. et al. A scanner for an ultrahigh-vacuum low-temperature scanning tunneling microscope. Instrum Exp Tech 50, 422–423 (2007). https://doi.org/10.1134/S0020441207030232
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DOI: https://doi.org/10.1134/S0020441207030232