Abstract
A method for calibrating a multilayer spectrometer using α particles is presented. This spectrometer is composed of successive semiconductor Si(Li) detectors and is used for precision detection of long-range charged particles (p, d, and t) with energies of ∼100 MeV. The factors affecting the accuracy of calibration are analyzed. This method is shown to guarantee high accuracy in measuring charged-particle energies.
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Original Russian Text © Yu.B. Gurov, K.N. Gusev, V.S. Karpukhin, S.V. Lapushkin, P.V. Morokhov, V.G. Sandukovsky, J. Yurkowski, 2006, published in Pribory i Tekhnika Eksperimenta, 2006, No. 5, pp. 34–38.
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Gurov, Y.B., Gusev, K.N., Karpukhin, V.S. et al. Calibration of a multilayer semiconductor spectrometer using α sources. Instrum Exp Tech 49, 624–628 (2006). https://doi.org/10.1134/S0020441206050034
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DOI: https://doi.org/10.1134/S0020441206050034