Abstract
The frequency coefficient, an important performance parameter of piezoelectric materials, which is used in determining vibrational frequencies of crystalline piezoelectric elements, is shown to vary along the length of a crystal. The dependences of the frequency coefficient and elastic stiffness coefficient on unit-cell parameters have the form of a parabolic function with a maximum, while the dependence of the frequency coefficient on \( {1 \mathord{\left/ {\vphantom {1 {(\sqrt \rho )}}} \right. \kern-\nulldelimiterspace} {(\sqrt \rho )}} \) (ρ is the density of the crystal) is linear. Polarity changes within a sample are revealed, which may be due to the stress arising from variations in melt composition during crystal growth.
Similar content being viewed by others
References
Young, R.A., Sakthivel, A., Moss, T.S., and Paiva-Santos, C.O., Rietveld Analysis of X-ray and Neutron Powder Diffraction Patterns, in User’s Guide to Program DBWS-9411, 1995.
Zhurov, V.V. and Ivanov, S.A., PROFIT Program for Structure Refinement Using Powder Diffraction Data, Kristallografiya, 1997, vol. 42, no. 2, 239–243.
Enraf-Nonius CAD-4 Software, Version 5.0, Delft: Enraf-Nonius, 1989.
Farrugia, L.J., WinGX-96: X-ray Crystallographic Programs for Windows, Version 1.5a, Glasgow: Univ. of Glasgow, 1996.
North, A.C.T., Phillips, D.C., and Mathews, F.S., A Semi-empirical Method of Absorption Correction, Acta Crystallogr, Sect. A: Cryst. Phys., Diffr., Theor. Gen. Crystallogr., 1968, vol. 24, no. 3, pp. 351–359.
Sheldrick, G.M., SHELXL-97: Program for the Solution and Refinement of Crystal Structures, Göttingen: Univ. of Göttingen, 1997.
Kuz’micheva, G.M., Rybakov, V.B., Domoroshchina, E.N., and Dubovskii, A.B., X-ray Diffraction Study of an Inhomogeneous Langasite (La3Ga5SiO4) Crystal, Neorg. Mater., 2002, vol. 38, no. 10, pp. 1234–1241 [Inorg. Mater. (Engl. Transl.), vol. 38, no. 10, pp. 1040–1047].
Domoroshchina, E.N., Effect of Growth Conditions on the Composition, Structure, and Properties of Langasite-Family Crystals, Extended Abstract of Cand. Sci. (Chem.) Dissertation, 2005, p. 24.
Kuzmicheva, G.M., Domoroschina, E.N., Rybakov, V.B., et al., A Family of Langasite: Growth and Structure, J. Cryst. Growth, 2005, vol. 275, pp. e715–e719.
Domoroshchina, E.N., Kuz’micheva, G.M., Rybakov, V.B., et al., Effect of Growth Conditions on the Structure and Optical Properties of La3Ga5SiO4 Crystals, Perspekt. Mater., 2004, no. 4, pp. 17–30.
Bohm, J., Chilla, E., Flannery, C., et al., Czochralski Growth and Characterization of Piezoelectric Single Crystals with Langasite Structure: La3Ga5SiO14 (LGS), La3Ga5.5Nb0.5O14 (LGN), and La3Ga5.5Ta0.5O14 (LGT): II. Piezoelectric and Elastic Properties, J. Cryst. Growth, 2000, vol. 216, pp. 293–298.
Kaminskii, A.A., Silvestrova, I.M., Sarkisov, S.E., and Denisenko, G.A., Investigation of Trigonal (La1 − x Ndx)3Ga5SiO14 Crystals, Phys. Status Solidi A, 1983, vol. 80, pp. 607–620.
Sakharov, S.A., Larionov, I.M., and Medvedev, A.V., Fundamental Shear Monolithic Filters Based on Langasite Crystals, Zarubezh. Radioelektron., 1994, nos. 9–10, pp. 12–18.
Fukuda, T., Takeda, H., Shimamura, K., et al., Growth of New Langasite Single Crystals for Piezoelectric Applications, IEEE/ETA Int. Frequency Control Symp. and Exhibition, 1998, pp. 315–319.
Mill, B.V. and Pisarevsky, Yu.V., Langasite-Type Materials: From Discovery to Present State, IEEE/ETA Int. Frequency Control Symp. and Exhibition, 2000, pp. 133–144.
Belokoneva, E.L., Stefanovich, S.Yu., Pisarevskii, Yu.V., and Mosunov, A.V., Refined Structures of La3Ga5SiO14 and Pb3Ga2Ge4O14 and the Crystal-Chemical Regularities in the Structure and Properties of Compounds of the Langasite Family, Zh. Neorg. Khim., 2000, vol. 45, no. 11, pp. 1786–1792.
Bohm, J., Chilla, E., Flannery, C., et al., Czochralski Growth and Characterization of Piezoelectric Single Crystals with Langasite Structure: La3Ga5SiO14 (LGS), La3Ga5.5Nb0.5O14 (LGN), and La3Ga5.5Ta0.5O14 (LGT): Part I, J. Cryst. Growth, 1999, vol. 204, pp. 128–136.
Roshchupkin, D.V., Irzhak, D.V., Roshchupkina, E.D., and Buzanov, O.A., Investigation of Structural Perfection and Acoustic Properties of La3Ga5SiO14 Crystals by High Resolution X-Ray Diffraction, Topography, and Microfluorescence Analysis, Crystallogr. Rep., 2004, vol. 49, pp. S80–S88.
Sakharov, S.A., Busanov, O.A., and Roshchupkin, D.V., Investigation of SAW and PSAW Propagation in LGS Crystals by Scanning Electron Microscopy Method, IEEE Int. Freq. Contr. Symp., 2003, pp. 698–700.
Irzhak, D.V., Roshchupkin, D.V., and Buzanov, O.A., X-ray Diffraction by SAW-Modulated La3Ga5SiO14 Crystals, Poverkhnost, 2003, no. 1, pp. 42–47.
Domoroshchina, E.N., Dubrovskii, A.B., Kuz’micheva, G.M., and Semenkovich, G.V., Influence of Point Defects on the Electrical Conductivity and Dielectric Properties of Langasite, Neorg. Mater., 2005, vol. 41, no. 11, pp. 1378–1381 [Inorg. Mater. (Engl. Transl.), vol. 41, no. 11, pp. 1218–1221].
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © A.B. Dubovskii, E.A. Tyunina, E.N. Domoroshchina, G.M. Kuz’micheva, and V.B. Rybakov, 2008, published in Neorganicheskie Materialy, 2008, Vol. 44, No. 5, pp. 601–607.
Rights and permissions
About this article
Cite this article
Dubovskii, A.B., Tyunina, E.A., Domoroshchina, E.N. et al. Composition effect on the elastic properties of langasite. Inorg Mater 44, 520–526 (2008). https://doi.org/10.1134/S0020168508050166
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S0020168508050166