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Microstructure and dielectric properties of (La0.9Sr0.1)[(Ga1−x Crx)0.8Mg0.2]O3−δ (x = 0−0.35) oxygen-ion-conducting solid solutions

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Abstract

The microstructure and dielectric properties of (La0.9Sr0.1)[(Ga1−x Crx)0.8Mg0.2]O3−δ (x = 0−0.35) oxygen-ion-conducting ceramics have been studied. The dielectric relaxation observed in the ceramics has been interpreted in terms of ionic transport in the grain bulk and across grain boundaries. The grains in the ceramics have been shown to consist of nanoscale domains, which seems to be due to a correlated distribution of the chromium dopant.

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Authors and Affiliations

  1. Karpov Research Institute of Physical Chemistry, Russian State Scientific Center, ul. Vorontsovo pole 10, Moscow, 105064, Russia

    E. D. Politova, G. M. Kaleva, A. V. Mosunov & S. G. Prutchenko

  2. Alikhanov Institute for Theoretical and Experimental Physics, Russian State Scientific Center, Bol’shaya Cheremushkinskaya ul. 25, Moscow, 117218, Russia

    B. A. Loginov

Authors
  1. E. D. Politova
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  2. B. A. Loginov
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  3. G. M. Kaleva
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  4. A. V. Mosunov
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  5. S. G. Prutchenko
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Original Russian Text © E.D. Politova, B.A. Loginov, G.M. Kaleva, A.V. Mosunov, S.G. Prutchenko, 2006, published in Neorganicheskie Materialy, 2006, Vol. 42, No. 7, pp. 888–896.

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Politova, E.D., Loginov, B.A., Kaleva, G.M. et al. Microstructure and dielectric properties of (La0.9Sr0.1)[(Ga1−x Crx)0.8Mg0.2]O3−δ (x = 0−0.35) oxygen-ion-conducting solid solutions. Inorg Mater 42, 806–814 (2006). https://doi.org/10.1134/S002016850607020X

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  • DOI: https://doi.org/10.1134/S002016850607020X

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