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Frequency dependences of dielectric properties of metal-insulator composites

  • Semiconductors and Dielectrics
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Abstract

Based on the fractal model of an inhomogeneous medium with a chaotic structure and the iteration method of averaging, frequency dependences of the dielectric properties of metal-insulator composites were determined. In the low-frequency limit, the considered methods of the investigation of two-component media were shown to permit one to obtain detailed information on the metal-insulator transition.

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Authors and Affiliations

  1. Odessa State Polytechnical University, Odessa, 65044, Ukraine

    V. V. Novikov

  2. Institute of Molecular Physics, Polish Academy of Sciences, Poznan, 60-179, Poland

    K. W. Wojciechowski

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  1. V. V. Novikov
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  2. K. W. Wojciechowski
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__________

Translated from Fizika Tverdogo Tela, Vol. 44, No. 11, 2002, pp. 1963–1969.

Original Russian Text Copyright © 2002 by Novikov, Wojciechowski.

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Novikov, V.V., Wojciechowski, K.W. Frequency dependences of dielectric properties of metal-insulator composites. Phys. Solid State 44, 2055–2062 (2002). https://doi.org/10.1134/1.1521455

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