Abstract
The X-ray diffraction topography technique based on the Borrmann effect was used to study the dislocated structure of Czochralski-grown indium-doped GaAs(001) crystals. Among the growth dislocations aligned in the [001] ingot growth direction, there are dislocations with large Burgers vectors (b=a〈100〉) and { 100} slip planes.
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Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 28, No. 18, 2002, pp. 24–28.
Original Russian Text Copyright © 2002 by Bu\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \)lov, Danil’chuk.
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Builov, A.N., Danil’chuk, L.N. Edge dislocations with large burgers vector in sphalerite crystals. Tech. Phys. Lett. 28, 762–764 (2002). https://doi.org/10.1134/1.1511777
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DOI: https://doi.org/10.1134/1.1511777