Abstract
The temperature dependence of electron concentration in CdGeAs2 single crystals grown by a new method is analyzed. The concentration of native defects and the activation energy are calculated. It is shown that the activation energy has a resonance character, and the concentration of native defects in the temperature range studied (10–500 K) far exceeds the electron concentration.
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S. I. Borisenko, V. Yu. Rud’, Yu. V. Rud’, and V. G. Tyuterev, Fiz. Tekh. Poluprovodn. (St. Petersburg) 35(6), 720 (2001) [Semiconductors 35, 690 (2001)].
I. K. Polushina, V. Yu. Rud’, Yu. V. Rud’, and T. N. Ushakova, Fiz. Tverd. Tela (St. Petersburg) 41, 1190 (1999) [Phys. Solid State 41, 1084 (1999)].
T. N. Morgan, Phys. Rev. A 139, 343 (1965).
S. I. Borisenko and G. F. Karavaev, Izv. Vyssh. Uchebn. Zaved., Fiz., No. 4, 101 (1988).
H. C. Casey, Jr. and F. Stern, J. Appl. Phys. 47, 631 (1976).
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Translated from Fizika i Tekhnika Poluprovodnikov, Vol. 35, No. 10, 2001, pp. 1175–1177.
Original Russian Text Copyright © 2001 by Borisenko.
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Borisenko, S.I. Analysis of the temperature dependence of electron concentration in CdGeAs2 single crystals. Semiconductors 35, 1123–1125 (2001). https://doi.org/10.1134/1.1410648
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DOI: https://doi.org/10.1134/1.1410648