Abstract
A technology has been elaborated and photodetector modules based on Hg1−x CdxTe/GaAs heterostructures and GaAs/AlGaAs multiquantum-well structures grown by molecular-beam epitaxy were fabricated for the 3–5 and 8–12 µm spectral ranges. The photosensitive HgCdTe layers were grown on the GaAs substrates with the intermediate buffer layer of CdZnTe. To decrease the surface effect on the recombination processes, the graded-gap Hg1−x CdxTe layers with x increasing towards the surface were grown. A silicon multiplexer was designed and fabricated by CMOS/CCD technology with a frame rate of 50 Hz. The hybrid microassembly of the photodetector array and the multiplexer was produced by group cold welding on indium columns while monitoring the connection process. The fabricated 128×128 modules based on HgCdTe layers with the cutoff wavelengths 6 and 8.7 µm had a temperature resolution of 0.02 K and 0.032 K, respectively, at a temperature of 78 K and a frame rate of 50 Hz. The photosensitive GaAs/AlGaAs multilayer quantum well structures were fabricated by MBE. It is shown that the technology developed allows 128×128 multielement photodetector arrays (λpeak=8 µm) to be produced with a temperature resolution of 0.021 K and 0.06 K at operating temperatures of 54 K and 65 K, respectively.
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Translated from Fizika i Tekhnika Poluprovodnikov, Vol. 35, No. 9, 2001, pp. 1159–1166.
Original Russian Text Copyright © 2001 by Ovsyuk, Sidorov, Vasil’ev, Shashkin.
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Ovsyuk, V.N., Sidorov, Y.G., Vasil’ev, V.V. et al. Arrays of 128×128 photodetectors based on HgCdTe layers and multilayer heterostructures with GaAs/AlGaAs quantum wells. Semiconductors 35, 1110–1116 (2001). https://doi.org/10.1134/1.1403577
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DOI: https://doi.org/10.1134/1.1403577