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The scanning tunneling microscopy and scanning tunneling spectroscopy of amorphous carbon

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Abstract

The most important methods for studying the surface of amorphous diamond-like carbon are scanning tunneling microscopy and scanning tunneling spectroscopy. In this review, publications concerned with studying the topography and electronic properties of the surface of amorphous diamond-like carbon films using a tunneling microscope are considered; related publications devoted to the microprobe study of field emission from amorphous carbon and to the tunneling microscopy of metal-carbon nanocomposites are also reviewed.

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Authors and Affiliations

  1. Ioffe Physicotechnical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, St. Petersburg, 194021, Russia

    V. I. Ivanov-Omskii, A. B. Lodygin & S. G. Yastrebov

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  1. V. I. Ivanov-Omskii
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  2. A. B. Lodygin
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  3. S. G. Yastrebov
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__________

Translated from Fizika i Tekhnika Poluprovodnikov, Vol. 34, No. 12, 2000, pp. 1409–1416.

Original Russian Text Copyright © 2000 by Ivanov-Omski\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l}\), Lodygin, Yastrebov.

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Ivanov-Omskii, V.I., Lodygin, A.B. & Yastrebov, S.G. The scanning tunneling microscopy and scanning tunneling spectroscopy of amorphous carbon. Semiconductors 34, 1355–1362 (2000). https://doi.org/10.1134/1.1331790

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