Abstract
An analysis is made of some characteristics of the propagation of a light wave through a semiconductor-gap-semiconductor structure, where the thickness of the gap between the parallel planes of the crystals is of the order of a micron. It is shown that a combination of multiple reflection and interference processes produces an exponential dependence of the transmitted radiation intensity on the refractive index of the material filling the gap. This circumstance can be used to set up a simple method for accurate determination of the refractive index of a transparent liquid.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
A. A. Shishlovskii, Applied Physical Optics [in Russian], Moscow (1961).
B. V. Ioffe, Refractometric Methods in Chemistry [in Russian], Leningrad (1983).
T. Ding and E. Garmire, Appl. Opt. 22, 3177 1983.
R. Th. Kersten, Opt. Commun. 13, 327 (1977).
V. M. Arutyunyan and Kh. V. Nerkararyan, Pis’ma Zh. Tekh. Fiz. 19(21), 44 (1993) [Tech. Phys. Lett. 19, 684 (1993)].
V. M. Arutyunyan and Kh. V. Nerkararyan, Fiz. Tverd. Tela. (St. Petersburg) 36, 1513 (1994) [Phys. Solid State 36, 827 (1994)].
Vl. M. Aroutionian and Kh. V. Nerkararian, Sensors Actuators 24–25, 353 (1995).
Vl. M. Arutyunyan and Kh. V. Nerkararyan, Pis’ma Zh. Tekh. Fiz. 21(16), 52 [Tech. Phys. Lett. 21, 656 (1995)].
Author information
Authors and Affiliations
Additional information
Pis’ma Zh. Tekh. Fiz. 23, 9–13 (May 12, 1997)
Rights and permissions
About this article
Cite this article
Nerkararyan, K.V., Markaryan, N.L. & Ogannisyan, E.D. A possible method to measure accurately the refractive index of a transparent liquid. Tech. Phys. Lett. 23, 337–338 (1997). https://doi.org/10.1134/1.1261869
Received:
Issue Date:
DOI: https://doi.org/10.1134/1.1261869