Skip to main content
SpringerLink
Log in

Numerical modeling of microplasma instability

  • Published:
Semiconductors Aims and scope Submit manuscript

Abstract

The basic features of current flow in the form of microplasma pulses have been confirmed by numerical modeling. It is shown that a microplasma can appear spontaneously in the presence of a local inhomogeneity in the space-charge region of a p-n structure, and the increase in the temperature of the structure as a result of Joule heating leads to microplasma suppression. The kinetics, shape, and duration of the microplasma pulses were studied numerically as a function of the applied voltage and the parameters of the semiconductor structure.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. I. V. Grekhov and Yu. N. Serezhkin, Avalanche Breakdown of p-n Junctions in Semiconductors [in Russian], Énergiya, Leningrad, 1980.

    Google Scholar 

  2. R. V. Konakova, P. Kordash et al., in Prediction of the Reliability of Semiconductor Avalanche Diodes [in Russian], edited by Yu. A. Tkhorik, Naukova dumka, Kiev, 1986.

    Google Scholar 

  3. V. V. Gafiichuk, B. I. Datsko, B. S. Kerner, and V. V. Osipov, Fiz. Tekh. Poluprovodn. 24, 724 (1990) [Sov. Phys. Semicond. 24, 455 (1990)].

    Google Scholar 

  4. V. A. Vashchenko, B. S. Kerner, V. V. Osipov, and V. F. Sinkevich, Fiz. Tekh. Poluprovodn. 24, 1705 (1990) [Sov. Phys. Semicond. 24, 1065 (1990)].

    Google Scholar 

  5. V. V. Gafiichuk, B. I. Datsko, B. S. Kerner, and V. V. Osipov, Fiz. Tekh. Poluprovodn. 24, 1282 (1990) [Sov. Phys. Semicond. 24, 806 (1990)].

    Google Scholar 

  6. B. S. Kerner and B. V. Osipov, Usp. Fiz. Nauk 157, 201 (1989) [Sov. Phys. Usp. 32, 101 (1989)].

    Google Scholar 

  7. P. L. Hower and K. G. Reddi, IEEE Trans. ED-17, 320 (1970).

    Google Scholar 

  8. S. Sze, Physics of Semiconductor Devices, Wiley, N.Y., 1981, 2nd edition [Russian translation, Mir, Moscow, 1984].

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Institute of Applied Problems of Mechanics and Mathematics, Ukrainian National Academy of Sciences, 290601, L’vov, Ukraine

    B. I. Datsko

Authors
  1. B. I. Datsko
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Fiz. Tekh. Poluprovodn. 31, 250–254 (February 1997)

Rights and permissions

Reprints and permissions

About this article

Cite this article

Datsko, B.I. Numerical modeling of microplasma instability. Semiconductors 31, 146–149 (1997). https://doi.org/10.1134/1.1187097

Download citation

  • Received:

  • Accepted:

  • Issue Date:

  • DOI: https://doi.org/10.1134/1.1187097

Keywords

Search

Navigation