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Evolution of the fractal surface of amorphous lead zirconate-titanate films during crystallization

  • Magnetism and Ferroelectricity
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Abstract

The recrystallization kinetics of amorphous lead zirconate-titanate films prepared by sol-gel technology are investigated experimentally using elastic scattering of light. Sequences of elastic dependences of the scattered light intensity are recorded directly during thermal annealing. The evolution of the morphology of the film surface during annealing is described in terms of the variation of their fractal dimensionalities D s. The experimental dependences D s(t) are compared with the results of a computer simulation of the phase transition kinetics in a thin plate (film).

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Authors and Affiliations

  1. Institute of Physics and Applied Mathematics, Ural State University, 620083, Ekaterinburg, Russia

    V. Ya. Shur, S. A. Negashev, A. L. Subbotin, D. V. Pelegov, E. A. Borisova & E. B. Blankova

  2. Intercollege Material Research Laboratory, Pennsylvania State University, University Park, PA, 16802, USA

    S. Trolier-McKinstry

Authors
  1. V. Ya. Shur
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  2. S. A. Negashev
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  3. A. L. Subbotin
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  4. D. V. Pelegov
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  5. E. A. Borisova
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  6. E. B. Blankova
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  7. S. Trolier-McKinstry
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Fiz. Tverd. Tela (St. Petersburg) 41, 306–309 (February 1999)

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Shur, V.Y., Negashev, S.A., Subbotin, A.L. et al. Evolution of the fractal surface of amorphous lead zirconate-titanate films during crystallization. Phys. Solid State 41, 274–277 (1999). https://doi.org/10.1134/1.1130767

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  • DOI: https://doi.org/10.1134/1.1130767

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