The structure of porous lead titanate–zirconate films, obtained by chemical deposition from solutions containing Brij 76, has been visualized for the first time using focused ion beam scanning electron microscopy nanotomography. Several techniques for determining the connectivity of pores and their distribution are presented. It is shown that the films have a highly connected system of pores regularly distributed in sublayers; this system is formed during multilayer deposition and subsequent crystallization.
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REFERENCES
A. L. Efros, M. Rosen, B. Averboukh, D. Kovalev, M. Ben-Chorin, and F. Koch, Phys. Rev. B 56, 3875 (1997).
I. A. Kolmychek, I. V. Malysheva, V. B. Novikov, A. I. Maydykovskiy, A. P. Leontiev, K. S. Napolskii, and T. V. Murzina, JETP Lett. 114, 653 (2021).
N. V. Mitetelo, S. E. Svyakhovskiy, A. D. Gartman, A. A. Kudrinskii, T. V. Murzina, and A. I. Maidykovskiy, JETP Lett. 107, 297 (2018)
S. M. Gates, D. A. Neumayer, M. H. Sherwood, A. Grill, X. Wang, and M. Sankarapandian, J. Appl. Phys. 101, 094103 (2007).
M. R. Baklanov and K. Maex, Philos. Trans. R. Soc. London, Ser. A 364, 201 (2006).
L. A. Golovan’, V. A. Mel’nikov, S. O. Konorov, A. B. Fedotov, S. A. Gavrilov, A. M. Zheltikov, P. K. Kashkarov, V. Yu. Timoshenko, G. I. Petrov, L. Li, and V. V. Yakovlev, JETP Lett. 78, 193 (2003).
J.-M. Yi, D. Wang, F. Schwarz, J. Zhong, A. Chimeh, A. Korte, J. Zhan, P. Schaaf, E. Runge, and C. Lienau, ACS Photon. 6, 2779 (2019).
V. A. Morozov, A. G. Zegrya, G. G. Zegrya, and G. G. Savenkov, JETP Lett. 114, 625 (2021).
V. Stancu, M. Buda, L. Pintilie, M. Popescu, and F. Sava, J. Optoelectron. Adv. Mater. 9, 1516 (2007).
A. Matavž, P. Koželj, M. Winkler, K. Geirhos, P. Lunkenheimer, and V. Bobnar, Thin Solid Films 732, 138740 (2021).
J. Roscow, Y. Zhang, J. Taylor, and C. R. Bowen, Eur. Phys. J. Spec. Top. 224, 2949 (2015).
D. P. Skinner, R. E. Newnham, and L. E. Cross, Mater. Res. Bull. 13, 599 (1978).
K. Ayusawa, T. Arai, H. Sato, K. Kawamura, T. Miyata, and K. Kobayashi, Jpn. J. Appl. Phys. 28, 187 (1989).
A. V. Atanova, O. M. Zhigalina, D. N. Khmelenin, G. A. Orlov, D. S. Seregin, A. S. Sigov, and K. A. Vorotilov, J. Am. Ceram. Soc. 105, 639 (2021).
A. S. Vishnevskiy, S. Naumov, D. S. Seregin, Y. H. Wu, W. T. Chuang, M. Rasadujjaman, J. Zhang, J. Leu, K. A. Vorotilov, and M. R. Baklanov, Materials (Basel) 13, 4484 (2020).
A. S. Vishnevskiy, D. S. Seregin, K. A. Vorotilov, A. S. Sigov, K. P. Mogilnikov, and M. R. Baklanov, J. Sol–Gel Sci. Technol. 92, 273 (2019).
A. Safari and E. K. Akdogan, Ferroelectrics 331, 153 (2006).
J. A. Taillon, C. Pellegrinelli, Y. L. Huang, E. D. Wachsman, and L. G. Salamanca-Riba, Ultramicroscopy 184, 24 (2018).
D. Grosso, F. Cagnol, G. Soler-Illia, E. L. Crepaldi, H. Amenitsch, A. Brunet-Bruneau, A. Bourgeois, and C. Sanchez, Adv. Funct. Mater. 14, 309 (2004).
G. J. A. A. Soler-Illia, P. C. Angelomé, M. C. Fuertes, D. Grosso, and C. Boissiere, Nanoscale 4, 2549 (2012).
L. Mahoney and R. T. Koodali, Materials (Basel) 7, 2697 (2014).
S. J. F. Herregods, K. Wyns, A. Buekenhoudt, and V. Meynen, Adv. Eng. Mater. 21, 1 (2019).
P. van der Voort, D. Esquivel, E. de Canck, F. Goethals, I. van Driessche, and F. J. Romero-Salguero, Chem. Soc. Rev. 42, 3913 (2013).
P. Thevenaz, U. E. Ruttimann, and M. Unser, IEEE Trans. Image Process. 7, 27 (1998).
Q. Tseng, I. Wang, E. Duchemin-Pelletier, A. Azioune, N. Carpi, J. Gao, O. Filhol, M. Piel, M. Théry, and M. Balland, Lab Chip 11, 2231 (2011).
J. Roels, F. Vernaillen, A. Kremer, A. Gonçalves, J. Aelterman, H. Q. Luong, B. Goossens, W. Philips, S. Lippens, and Y. Saeys, Nat. Commun. 11, 771 (2020).
I. Arganda-Carreras, V. Kaynig, C. Rueden, K. W. Eliceiri, J. Schindelin, A. Cardona, and H. S. Seung, Bioinformatics 33, 2424 (2017).
J. Ollion, J. Cochennec, F. Loll, C. Escudé, and T. Boudier, Bioinformatics 29, 1840 (2013).
L. Holzer, F. Indutnyi, P. Gasser, B. Münch, and M. J. Wegmann, J. Microsc. 216, 84 (2004).
T. Hildebrand and P. Ruegsegger, J. Microsc. 185, 67 (1997).
R. Dougherty and K.-H. Kunzelmann, Microsc. Microanal. 13, 1678 (2007).
J. A. Taillon, Dissertation (Univ. Maryland, College Park, USA, 2016).
H. Homann, Insight J. 421, 1 (2007). https://doi.org/10.54294/xjdr5f
D. Gostovic, N. J. Vito, K. A. O’Hara, K. S. Jones, and E. D. Wachsman, J. Am. Ceram. Soc. 94, 620 (2011).
I. Arganda-Carreras, R. Fernández-González, A. Muñoz-Barrutia, and C. Ortiz-De-Solorzano, Microsc. Res. Technol. 73, 1019 (2010).
H. J. Johnson, M. McCormick, and L. Ibáñez, The ITK Software Guide, Vol. 1: Introduction and Development Guidelines, Vol. 2: Design and Functionality, 4th ed., Updated for ITK version 5.2.0 (Insight Software Consortium, 2021). https://itk.org/ItkSoftwareGuide.pdf.
K. A. Vorotilov, O. M. Zhigalina, V. A. Vasiljev, and A. S. Sigov, Phys. Solid State 51, 1337 (2014).
K. Vorotilov, A. Sigov, D. Seregin, Yu. Podgorny, O. Zhigalina, and D. Khmelenin, Phase Trans. 86, 1152 (2013).
S. Agarwal and G. W. Ho, Mater. Lett. 63, 1624 (2009).
Funding
This study was supported by the Ministry of Science and Higher Education of the Russian Federation (state assignment for the Federal Scientific Research Centre “Crystallography and Photonics” of the Russian Academy of Sciences) in the part of sample preparation and TEM studies and by the Russian Foundation for Basic Research (project no. 20-32-90056) in the part of FIB–SEM nanotomography studies.
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Atanova, A.V., Khmelenin, D.N. & Zhigalina, O.M. Influence of Crystallization on the 3D Structure of Pores in Ferroelectric PZT Films. Jetp Lett. 116, 716–722 (2022). https://doi.org/10.1134/S0021364022602056
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DOI: https://doi.org/10.1134/S0021364022602056