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Integrated photonics

Device-level photonic testing

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Non-invasive, multispectral characterization of integrated photonic circuits paves the way towards optical methodologies ready for industrial applications.

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Figure 1: Schematic of the ultrafast photomodulation spectroscopy set-up employed by Bruck et al.1

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Authors and Affiliations

  1. Matteo Burresi is at Istituto Nazionale di Ottica (CNR-INO), Largo Fermi 6, 50125 Firenze (FI), Italy and also at the European Laboratory for Non-linear Spectroscopy (LENS), 50019 Sesto Fiorentino (FI), Italy,

    Matteo Burresi

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  1. Matteo Burresi
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Correspondence to Matteo Burresi.

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Burresi, M. Device-level photonic testing. Nature Photon 9, 8–9 (2015). https://doi.org/10.1038/nphoton.2014.313

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