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Analysis for rare earth elements in accessory minerals by specimen isolated secondary ion mass spectrometry

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Abstract

The distribution of rare earth elements (REEs) in minerals and mineral assemblages is of considerable geochemical significance. However, because of their low levels in most minerals, analysis for REEs is a considerable challenge. The application of secondary ion mass spectrometry (SIMS) to this problem has been limited by the presence of molecular ion interferences in the secondary ion mass spectrum. We describe here the application of the specimen isolation technique1 to rare earth analysis by SIMS. The method effectively suppresses molecular ions while maintaining sufficient sensitivity to examine REE distribution in a variety of accessory minerals.

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Authors and Affiliations

  1. Departments of Chemistry and Geology, University of Western Ontario, London, Ontario, N6A 5B7, Canada

    J. B. Metson, G. M. Bancroft, H. W. Nesbitt & R. G. Jonasson

Authors
  1. J. B. Metson
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  2. G. M. Bancroft
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  3. H. W. Nesbitt
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  4. R. G. Jonasson
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Metson, J., Bancroft, G., Nesbitt, H. et al. Analysis for rare earth elements in accessory minerals by specimen isolated secondary ion mass spectrometry. Nature 307, 347–349 (1984). https://doi.org/10.1038/307347a0

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