Abstract
We present resugts from experiments utilizing third sound and atomic force microscopy (AFM) that are designed to test the reproducibility of the surface roughness obtained by CaF2 thermal deposition onto borosilicate glass substrates. Third sound speed vs. 4He film thickness data show reasonable agreement for all samples. Statistical analysis of the AFM measurements confirm that surfaces with similar roughness characteristics (∼10 nm) can be fabricated using a common deposition protocol.
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Luhman, D.R., Hallock, R.B. 4He Third Sound and AFM Characterization of Rough Calcium Fluoride Substrates. Journal of Low Temperature Physics 134, 245–250 (2004). https://doi.org/10.1023/B:JOLT.0000012562.74005.67
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DOI: https://doi.org/10.1023/B:JOLT.0000012562.74005.67