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Mapping the Stiffness of Nanomaterials and Thin Films by Acoustic AFM Techniques

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Handbook of Nanomaterials Properties

Abstract

The determination of the stiffness of nanomaterials is essential to understanding their response to force and for the successful integration of these materials into devices. In this chapter we review acoustic atomic force microscope (AFM) techniques that are used to map the stiffness distribution of nanomaterials and thin films nondestructively and with high lateral resolution. We focus on three acoustic AFM techniques: force modulation microscopy (FMM), ultrasonic force microscopy (UFM), and contact resonance atomic force microscopy (CR-AFM). We explain the basics of the AFM tip–surface contact mechanics, the theoretical background of each acoustic AFM method, its use to determine the stiffness properties of nanomaterials and thin films, and its limitation. The techniques we discuss have been used to characterize the mechanical properties of a broad range of nanomaterials and thin films, including self-assembled monolayers, thin polymer films, nanocomposites, and biomaterials.

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Acknowledgments

SZ acknowledges support by the NSF through grant DMR-1121107 (MRSEC).

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Authors and Affiliations

  1. Department of Mechanical Engineering and Material Science, Duke University, 144 Hudson Hall, 90300, Durham, NC, 27708, USA

    Stefan Zauscher, Zehra Parlak & Qing Tu

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  1. Stefan Zauscher
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  2. Zehra Parlak
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Correspondence to Stefan Zauscher .

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Editors and Affiliations

  1. Nanoprobe Laboratory for Bio- & Nanotechnology and Biomimetics, Ohio State University, Columbus, Ohio, USA

    Bharat Bhushan

  2. Department of Biological and Environmental Engineering, Cornell University, Ithaca, New York, USA

    Dan Luo

  3. Division of Restorative, Prosthetic and Primary Care, The Ohio State University, College of Dentistry, Columbus, Ohio, USA

    Scott R. Schricker

  4. Department of Materials Science and Engineering, University of Florida, Gainesville, Florida, USA

    Wolfgang Sigmund

  5. Department of Mechanical Engineering and Materials Science, Duke University, Durham, North Carolina, USA

    Stefan Zauscher

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Zauscher, S., Parlak, Z., Tu, Q. (2014). Mapping the Stiffness of Nanomaterials and Thin Films by Acoustic AFM Techniques. In: Bhushan, B., Luo, D., Schricker, S., Sigmund, W., Zauscher, S. (eds) Handbook of Nanomaterials Properties. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-31107-9_40

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