Abstract
The goal of this contribution is to use a three dimensional (3D) full-band particle-based simulator to investigate 3D scaling effects of static and dynamic current-voltage characteristics of GaAs MESFET structures. The full-band particle-based simulator is also applied to a novel dual-gate GaAs MESFET structure.
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Branlard, J., Aboud, S., Goodnick, S. et al. Frequency Analysis of 3D GaAs MESFET Structures Using Full-Band Particle-Based Simulations. Journal of Computational Electronics 2, 213–217 (2003). https://doi.org/10.1023/B:JCEL.0000011427.63034.4e
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DOI: https://doi.org/10.1023/B:JCEL.0000011427.63034.4e