Abstract
A universal fiber-optic spectroscope has been developed that allows one to study state-of-the-art semiconductor structures by various methods employing the modulated reflection of light. Among these are both the well-known traditional methods of photoreflection and electroreflection and the new methods of longitudinal current modulated reflection and below-bandgap photoreflection. The possibilities of the spectroscope are demonstrated by studies of the semiconductor structures used to manufacture high electron mobility transistors and high-power semiconductor lasers.
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Sotnikov, A.E., Chernikov, M.A. & Ryabushkin, O.A. A Universal Fiber-Optic Spectroscope for Studying the Modulated Reflection of Semiconductor Structures. Instruments and Experimental Techniques 47, 656–661 (2004). https://doi.org/10.1023/B:INET.0000043875.03173.d7
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DOI: https://doi.org/10.1023/B:INET.0000043875.03173.d7