Abstract
An X-ray tomographic system has been developed to measure the intensity of soft X rays and construct a two-dimensional profile of the electron temperature in plasma generated by the TOKAMAK T-11M facility. The system is based on cooled semiconductor CdTe detectors and is designed to operate in the energy range of 3–8 keV.
Similar content being viewed by others
REFERENCES
Hill, K.W., Young, K.M., Bitter, M., et al., Rev. Sci. Instrum., 1992, vol. 63, p. 10.
Peysson, Y., Coda, S., and Imbeaux, F., Nucl. Instrum. Methods Phys. Res., Sect. A, 2001, vol. 458, p. 269.
Savrukhin, P.V., Doctoral (Phys.-Math.) Dissertation, Moscow: RNTs “Kurchatovskii institut,” 2001.
Glasser, F., Thomas, G., Cuzin, M., and Verger, L., Nucl. Instrum. Methods Phys. Res., Sect. A, 1992, vol. 322, p. 619.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Kuznetsov, V.V., Amosov, A.V., Amosov, V.N. et al. An X-ray Tomographic System for the TOKAMAK T-11M Facility. Instruments and Experimental Techniques 47, 240–241 (2004). https://doi.org/10.1023/B:INET.0000025209.30942.dc
Issue Date:
DOI: https://doi.org/10.1023/B:INET.0000025209.30942.dc