Abstract
Phase pure powder and thin films of the novel ferroelectric materials SrBi2Ta2O9 (SBT) have been prepared using the organic precursors. The xero-gel formed was dried and characterized using TGA and DTA to determine the organic burn out and crystallization temperature of SBT. Powder X-ray diffraction was used systematically to check the crystallinity of SBT. Phase pure SBT powder was formed as low as 650°C and thin films at 600°C in comparison to other earlier reported work. SEM micrographs show a grain size of ∼0.1 μm and show crack free films with a film thickness of 2 μm.
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Ravichandran, D., Yamakawa, K., Bhalla, A. et al. Alkoxide Derived SrBi2Ta2O9 Phase Pure Powder and Thin Films. Journal of Sol-Gel Science and Technology 9, 95–101 (1997). https://doi.org/10.1023/A:1026468525300
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DOI: https://doi.org/10.1023/A:1026468525300