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X‐Ray Photoelectron‐ and Auger‐Spectroscopic Study of Superstoichiometric Fluorographite‐Like Materials

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Abstract

X‐ray photoelectron spectroscopy (XPS) and Auger spectroscopy methods were used to study industrial fluorographite‐like fluorocarbon materials (FCMs) of superstoichiometric CF1.25–1.33 composition [fluorosibunite (FS) and T‐900 fluorinated soot (FT)] and fluorinated graphites of CF0.88–1.08 composition. Based on XPS analysis, models were proposed for the surface layer structures in nanofragments of the FCMs and fluorographite. The main structural element of the FCMs and fluorographites studied here is a corrugated carbon network with CF and CF2 groups of several types. The CF networks of the FCM structures contain holes formed upon fluorination of the initial carbon materials and filled with alternating CF and CF2 groups. The bond energies of the inner C1s and F1s levels and the kinetic energies of F KLL Auger spectra suggest a covalent nature of all types of bonds between the carbon and fluorine atoms. Calculations using XPS data revealed common and specific features in correlations between the volume stoichiometry of the FCMs and fluorographites and the atomic F/C ratios in the surface layers of the materials.

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Authors and Affiliations

  1. Institute of Inorganic Chemistry, Siberian Branch, Russian Academy of Sciences, Novosibirsk

    V. N. Mitkin, I. P. Asanov & L. N. Mazalov

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  1. V. N. Mitkin
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  2. I. P. Asanov
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  3. L. N. Mazalov
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Mitkin, V.N., Asanov, I.P. & Mazalov, L.N. X‐Ray Photoelectron‐ and Auger‐Spectroscopic Study of Superstoichiometric Fluorographite‐Like Materials. Journal of Structural Chemistry 43, 843–855 (2002). https://doi.org/10.1023/A:1022837626947

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