Skip to main content
SpringerLink
Log in

Current controlled negative resistance phenomenon in SbPbSe system

  • Published:
Czechoslovak Journal of Physics Aims and scope

Abstract

Thin film Al/Sb2Pb1Se7/Al metal-glass-metal sandwiched structures prepared using thermal evaporation technique have been studied. The I–V measurements showed that the devices switched from high resistance ‘OFF’ state to a low resistance ‘ON’ state when a particular voltage appeared across it. The ‘OFF’ state I–V characteristics showed non-ohmic behaviour while in the ‘ON’ state the devices displayed purely linear characteristics. The switching voltage (V th) was found to depend on film thickness and temperature of the device. A linear relation between Vth and temperature was observed.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. S.R. Ovshinsky: Phys. Rev. Letts. 21 (1968) 1450.

    Google Scholar 

  2. S. Prakash and S. Ashokan: J. Phys. D 29 (1996) 2004.

    Google Scholar 

  3. H. Hirashima, M. Ide, and T. Yoshida: J. Non-Cryst. Solids 86 (1986) 327.

    Google Scholar 

  4. S.C.K. Misra, T.P. Sharma, S.K. Sharma, V. Kumar, and S.K. Sharma: Ind. J. Pure Appl. Phys. 35 (1997) 508.

    Google Scholar 

  5. M. Ouyang, K.Z. Wang, H.X. Zang, Z.Q. Xue, and C.H. Huang: Thin Solid Films 288 (1996) 296.

    Google Scholar 

  6. J.F. Gibbons and W.E. Beadhe: Solid State Electronics 1 (1961) 785.

    Google Scholar 

  7. V.S. Shirodkar and A. Chourey: J. Mat. Sci. Letts. 7 (1988) 1235.

    Google Scholar 

  8. D.R. Lamb and P.C. Rundle: J. Appl. Phys. 18 (1967) 29.

    Google Scholar 

  9. D. Adler: J Vac. Sci. 10 (1973) 728.

    Google Scholar 

  10. G.S. Nadkarni and V.S. Shirodkar: Thin Solid Films 105 (1983) 115.

    Google Scholar 

  11. H.P. Klug and L.E. Alexander: X-ray Diffraction Procedures (for amorphous and crystalline materials), John Wiley and Sons, Chapter 9.

  12. S.M. Wagle and V.S. Shirodkar: Brazilian J. Phys. (accepted for publication).

  13. J.G. Simmon: J. Phys. D 4 (1971) 613.

    Google Scholar 

  14. P.S. Nikam and H.S. Aher: Ind. J. Pure Appl. Phys. 34 (1996) 393.

    Google Scholar 

  15. R.C. Weast, Ed.: Handbook of Chemistry and Physics, 57th Edition, CRC Press, 1976–77, B-124.

  16. M.M. Hafiz, M.M. Tbrabim, and A.S. Ahmed: Phys. Status Solidi A 71 (1982) 259.

    Google Scholar 

  17. G.D. Dearnaley, D.V. Morgan, and A.M. Stoneham: J. Non-Cryst. Solids 4 (1970) 593.

    Google Scholar 

  18. S.R. Ovshinsky and H. Fritzsche: IEEE Trans. Electron. Dev. ED-20 (1973) 91.

    Google Scholar 

  19. P.J. Walsh, R. Vogel, and E.J. Evans: Phys. Rev. 178 (1969) 1274.

    Google Scholar 

  20. D.W. Deis, E.A. Dancy, and A. Patterson: J. Non-Cryst. Solids 2 (1970) 141.

    Google Scholar 

  21. G.S. Nadkarni, N. Sankarraman, and S. Radhakrishanan: J. Phys. D: Appl. Phys. 16 (1983) 897.

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Solid State Electronics Lab., Department of Physics, The Institute of Science, 15, Madam Cama Road, Mumbai –, 400 032, India

    Shaila Wagle & Vinay Shirodkar

Authors
  1. Shaila Wagle
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Vinay Shirodkar
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Wagle, S., Shirodkar, V. Current controlled negative resistance phenomenon in SbPbSe system. Czechoslovak Journal of Physics 50, 635–643 (2000). https://doi.org/10.1023/A:1022810402344

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1023/A:1022810402344

Keywords

Search

Navigation