Abstract
An automated setup for measuring nonlinear optical parameters (nonlinear refractive indices, third-order nonlinear susceptibilities, nonlinear absorption coefficients) of various materials by the Z-scan method has been developed. Using this system, these parameters were determined for fullerene-doped polyimide films, colloidal solutions of metals, semiconductor chalcogenide films, dye solutions, and metal-doped polyvinylpyrrolidone.
Similar content being viewed by others
REFERENCES
Weber, M.J., Milam, D., and Smith, W.L., Opt. Eng., 1978, vol. 17, p. 463.
Friberg, S.R. and Smith, P.W., IEEE J. Quantum Electron., 1987, vol. 23, p. 2089.
Adair, R., Chase, L.L., and Payne, S.A., J. Opt. Soc. Am. B, 1987, vol. 4, p. 875.
Sheik-Bahae, M., Said, A.A., and Van Stryland, E.W., Opt. Lett., 1989, vol. 14, p. 955.
Sheik-Bahae, M., Said, A.A., Wei, T., et al., IEEE J. Quantum Electron., 1990, vol. 26, p. 760.
Said, A.A., Sheik-Bahae, M., Hagan, D.J., et al., J. Opt. Soc. Am. B, 1992, vol. 9, p. 405.
Reintjes, J., Nonlinear-Optical Parametrical Processes in Liquids and Gases, London: Academic, 1984. Translated under the title Nelineinye opticheskie parametricheskie protsessy v zhidkostyakh i gazakh, Moscow: Mir, 1987.
Adair, R., Chase, L.L., and Payne, S.A., Phys. Rev. B, 1989, vol. 39, p. 3337.
Ganeev, R.A., Ryasnyansky, A.I., Kodirov, M.K., and Usmanov, T., Opt. Commun., 2000, vol. 185, p. 473.
Ganeev, R.A., Ryasnyansky, A.I., Kodirov, M.K., et al., J. Phys. D, 2001, vol. 34, p. 1602.
Ganeev, R.A., Kamalov, S.R., Kulagin, I.A., et al., Nonlinear Opt, 2002, vol. 28, p. 263.
Ganeev, R.A., Ryasnyanskii, A.I., Kodirov, M.K., and Usmanov, T., Opt. Spektrosk., 2001, vol. 91, p. 878.
Ganeev, R.A., Ryasnyansky, A.I., Kodirov, M.K., et al., Appl. Phys. B, 2002, vol. 75, p. 48.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Ganeev, R.A., Kamalov, S.R., Kulagin, I.A. et al. An Automated Setup for Investigating Nonlinear Optical Characteristics of Various Materials by the Z-scan Method. Instruments and Experimental Techniques 45, 810–815 (2002). https://doi.org/10.1023/A:1021443424991
Issue Date:
DOI: https://doi.org/10.1023/A:1021443424991